A method and device for measuring and calculating the exit angle of Tamm coupling based on excitation registration
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NANJING UNIV OF SCI & TECH
- Publication Date
- 2021-07-06
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Abstract
Description
technical field
[0001] The invention relates to the field of measurement and calculation of micro-optoelectronics, in particular to a method and device for measuring and calculating a Tam coupling exit angle based on excitation registration. Background technique
[0002] In the field of research and development of integrated optical devices, due to technological innovations such as nano-quantum structures, photonic crystals, and micro-resonators, as well as the continuous development of miniaturization of micro-cavity lasers, nano-optical waveguides, and nano-optical detectors, smaller devices, more compact The integrated and lower-cost processing technology has a very wide range of applications in disciplines such as silicon-based optoelectronics, and occupies a key technology in many core technologies such as sensing, display, and detection. Therefore, micro-nano-scale optoelectronic element detection Devices have been successfully developed recently. The processing on th...