Method and system for correcting spectrograph wavelength shift

A technology of wavelength drift and spectrometer, applied in the field of spectrometer calibration, to achieve the effect of fast correction process, wide coverage and easy search

Pending Publication Date: 2019-06-14
BEIJING SDL TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to quickly solve the problem of spectral drift caused by vibration and mechanical deformation of the spectrometer at the application site, and to provide a method and system for correcting the wavelength drift of the spectrometer

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  • Method and system for correcting spectrograph wavelength shift
  • Method and system for correcting spectrograph wavelength shift

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Embodiment Construction

[0031] The specific implementation manners of the present invention will be described in more detail below in conjunction with the accompanying drawings and examples, so as to better understand the solution of the present invention and its advantages in various aspects. However, the specific embodiments and examples described below are for the purpose of illustration only, rather than limiting the present invention.

[0032] The execution order of each step in the method mentioned in the present invention, unless otherwise specified, is not limited to the order reflected in the text herein, that is to say, the execution order of each step can be changed, and between two steps Additional steps can be inserted as needed.

[0033] Since the spectrometer is a precision component, a slight movement of any optical component in the structure or a slight deformation of the mechanical support frame will cause the corresponding wavelength signal on the detector to drift, and the applica...

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Abstract

The invention relates to a method and system for correcting spectrograph wavelength shift. The method comprises the steps that: a, to-be-corrected pixel points and corresponding spectral signals thereof of standard gas characteristic absorption bands of detected gas are collected by a to-be-corrected spectrograph; b, to-be-corrected pixel points of absorption peak points in the standard gas characteristic absorption bands are determined through the spectral signals; c, a correction factor is obtained by matching the to-be-corrected pixel points of the absorption peak points and the pixel points in reference corresponding relationship of the absorption peak points, and the datum corresponding relationship of the absorption peak points is a datum corresponding relationship of the absorptionpeak points and the pixel points in the standard gas characteristic absorption bands of detected gas collected by the corrected spectrograph; and d, the pixel points of the detected gas collected by the to-be-corrected spectrograph are corrected by the correction factor. The method for correcting the spectrograph wavelength shift has wide coverage and is suitable for wavelength correction of spectrographs with a plurality of types and wavelength ranges.

Description

technical field [0001] The invention generally relates to the field of spectrometer calibration, in particular to a method and system for correcting the wavelength drift of a spectrometer. Background technique [0002] During the application of the spectrometer, due to the vibration of the instrument or the vibration and collision during transportation, the detector of the spectrometer will move, and the mechanical structure will have a certain deformation. At this time, the corresponding relationship between the pixels of the spectrometer and the detected wavelength is Deviations will occur, and the signal-to-noise ratio and detection limit of the spectrometer will deteriorate. [0003] Generally, the spectrometer is corrected by a mercury lamp. The method specifically includes: firstly, determining whether the wavelength signal of the spectrum has been shifted, and then correcting through the corresponding relationship between a specific wavelength and a pixel point. Howe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/27
Inventor 敖小强张廷邦关旭春
Owner BEIJING SDL TECH
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