Register testing method and system

Abstract

The invention relates to the technical field of chip register function testing, in particular to a register testing method and system. The register testing method specifically comprises the followingsteps: determining bit domain information of a register and setting register attribute information of each bit domain; obtaining register information of the tested register, wherein the register information comprises bit domain information of the register and register attribute information of each bit domain; sequentially judging register attributes of each bit domain of the tested register according to the acquired register information and the bit domain of the tested register; and according to the bit domain register attributes of the tested register, testing matched with the register attributes of the tested register in sequence. The register test system comprises a bit domain setting module, an acquisition module, a judgment module and a test module. According to the register testing method and system, automatic testing of special registers with various attributes can be achieved.

Description

technical field [0001] The invention relates to the technical field of chip register function test, in particular to a register test method and system. Background technique [0002] The realization of the function of the chip is accomplished through different configurations of the registers. In the process of chip verification, register verification is the most basic and important task, and the correctness of register functions is the most basic prerequisite to ensure the realization of chip functions. [0003] Registers are generally divided into readable and writable registers, read-only registers, write-only registers, and write 1 to clear 0 registers. [0004] For readable and writable registers, the test is generally carried out by writing, reading, and comparing. That is, write a fixed value or a random value to the register, read the register, compare the written value with the read value, and pass the test if they are consistent, otherwise the test fails. [0005]...

AI Technical Summary

Problems solved by technology

Or a 32-bit register, although it can be read and written, but writing corresponds to one function, and reading corresponds to another function. In order to save space, two registers that should be read-only and write-only are made into one register. If this kind of register is tested by writing, reading, and comparing, the written value and the read value must be different, and the result obtained by this method must be wrong.

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