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METHOD FOR SELECTING LEADING ASSOCIATED PARAMETER AND METHOD FOR pre-diagnosis of device maintenance

A technology of auxiliary parameters and key parameters, applied in data processing applications, knowledge expression, biological neural network models, etc., can solve problems such as insufficient early warning capabilities of pre-diagnosis models

Active Publication Date: 2019-07-02
MARKETECH INT
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Problems solved by technology

[0005] The main purpose of the present invention is to solve the problem that the existing equipment maintenance pre-diagnosis model only focuses on the factors most related to equipment failure, and the monitoring factors are too single and simplified, which leads to the shortcoming that the early warning ability of the pre-diagnosis model is not leading enough

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  • METHOD FOR SELECTING LEADING ASSOCIATED PARAMETER AND METHOD FOR pre-diagnosis of device maintenance

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[0019] Relevant detailed description and technical content of the present invention, now just explain as follows with respect to matching drawing:

[0020] A method for selecting leading auxiliary parameters in an embodiment of the present invention is as follows: figure 1 , including the following steps (S11) to (S14), the leading auxiliary parameter is related to an operation output from the operating system, hardware device, or machine:

[0021] With the development of the Internet of Things industry, most of the new devices currently including an operating system, a hardware device, or a machine can perform real-time data output functions through the sensors installed therein, thereby collecting a large amount of sensor data (sensor data) ), and store the sensed data in, for example, a memory including a database.

[0022] Therefore, in step (S11), the sensing data stored in the database can be pre-processed (data pre-processing) through a processor, that is, erroneous da...

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Abstract

The present invention provides a method for selecting a leading associated parameter and a method for pre-diagnosis of device maintenance. Selection is performed on data collected by a sensor, and thedata is divided into a critical parameter set and another feature parameter set. From the feature parameter set, one parameter that affects beforehand in time the critical parameter is identified asa leading associated parameter. The present invention further uses the critical parameter set and the leading associated parameter to construct an equipment prognostic and health management model thateffectively enhances an early warning capability.

Description

technical field [0001] The present invention relates to a pre-diagnosis method for equipment maintenance, especially a pre-diagnosis method that combines critical parameters (CP) and leading associated parameters (LAP) to improve equipment maintenance prediction capabilities. Background technique [0002] In order to meet the quality and stability requirements of mass production, the manufacturing industry has strict monitoring and observation of key process parameters. The so-called "key process parameters" refer to the factors most related to equipment failure. For example, when the equipment has abnormalities such as bearing damage and wire short circuit, etc., it is often accompanied by an abnormal rise in equipment temperature. Therefore, especially motors equipment, "temperature" is considered a key process parameter. [0003] These "key process parameters" can be used as indicators for predictive diagnosis of equipment maintenance. However, in order to improve the ac...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/418
CPCG05B19/41885G05B2219/32339G06N3/02G05B23/024G06Q50/04G06N5/022Y02P90/30G06N7/01
Inventor 韦建名王钰仁张皓衍
Owner MARKETECH INT
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