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A single-exposure x-ray two-dimensional phase-contrast imaging method

A phase-contrast imaging and X-ray technology, applied in the field of X-ray imaging, can solve the problems of reducing the ability of defect detection and detail resolution, increasing the imaging time, and complicating the acquisition process, so as to improve the ability of object detail resolution and defect detection, radiation The effect of reducing the dose of radiation and simplifying the collection process

Active Publication Date: 2021-12-28
LANZHOU UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, at present, the edge illumination method needs to move the coded diaphragm once, perform an exposure at two positions respectively, and collect two original images to quantitatively extract phase and absorption information, resulting in complicated acquisition process and increased imaging time, which is not conducive to practical application
In addition, the edge illumination method only realizes one-dimensional phase contrast imaging. Since the phase information (refraction angle information in this method) has directionality, the refraction angle information can be extracted in both vertical and horizontal directions. One-dimensional phase contrast imaging Some detail information of the object will be lost, reducing the ability of defect detection and detail resolution
[0007] To sum up, the problems existing in the prior art are: two exposures are required in the imaging process, and two-dimensional phase-contrast imaging has not been realized

Method used

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  • A single-exposure x-ray two-dimensional phase-contrast imaging method
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  • A single-exposure x-ray two-dimensional phase-contrast imaging method

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Embodiment 1

[0038] see Figure 1-7 As shown, a single-exposure X-ray two-dimensional phase-contrast imaging method, its structure includes an X-ray source 101, a coding aperture M-103 and an area array detector 106, and the method specifically includes the following steps:

[0039]Step 1: The coded diaphragm M-103 is placed in front of the X-ray source 101, and the X-ray beam is periodically divided into many thin beams. The period P of the coded diaphragm M-103 is determined by the pixel size d of the area array detector 106, And the distance D from the X-ray source 101 to the coding aperture M-103 1 And the distance D from the encoding aperture M-103 to the area array detector 106 2 jointly determined, can be expressed as P=2d / m, where m is the amplification factor, can be expressed as m=(D 1 +D 2 ) / D 1 , the opening size of the coded diaphragm M-103 is a;

[0040] Step 2: using four adjacent pixels of the area array detector 106 as a detection unit 107, the X-ray sub-beam 105 emit...

Embodiment 2

[0059] Due to the influence of pixel crosstalk, image contrast and line-to-noise ratio will be reduced. In this embodiment, coding aperture M2 408 is added to block adjacent areas of pixels to reduce the influence of pixel crosstalk, such as Figure 4 shown. In order to compare with the aforementioned imaging method, the experimental conditions of Example 2 are the same as those of Example 1 except that the coded aperture M-408 is added and the opening width a of the coded aperture M-103 is set to 32 μm. The case where the coding aperture M2408 blocks the detector unit and the X-ray irradiation conditions are as follows Figure 5 As shown, the coding aperture M2 408 blocks the width b of the edge of the pixel to 20 μm. This condition makes the X-ray irradiation area of ​​the four pixels in the second embodiment the same as that in the first embodiment. Carry out numerical simulation experiments based on the above experimental conditions, and use the imaging method proposed by...

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Abstract

The invention discloses a single-exposure X-ray two-dimensional phase contrast imaging method. The method specifically includes the following steps: during imaging, the measured object is placed between the encoding aperture M1 and the area array detector, and is close to the encoding Aperture M1, the absorption and refraction of X-rays by the measured object will cause the intensity and direction of X-rays to change, so that the ray intensity I detected by the detector pixels 1 , I 2 , I 3 and I 4 Changes occur, and quantified phase and absorption information are extracted by their relative changes, thereby realizing single-exposure X-ray two-dimensional phase contrast imaging. The beneficial effects of the invention are: the invention simplifies the acquisition process, from the original two exposures to a single exposure, and the imaging time and radiation dose are reduced by 50% compared with the original. The single exposure method can not only realize dynamic and online phase contrast imaging, but also facilitate the realization of X-ray phase contrast CT technology. The invention can realize two-dimensional phase contrast imaging, and can improve the ability of object detail resolution and defect detection.

Description

technical field [0001] The invention belongs to the field of X-ray imaging, in particular to an X-ray two-dimensional phase-contrast imaging method that only needs a single exposure. Background technique [0002] In traditional X-ray imaging, the image contrast is based on the object’s absorption of X-rays. For strongly absorbing objects, it can give a higher image contrast, but for weakly absorbing objects, such as human soft tissue and fiber materials, the image contrast is low. In addition, for objects with similar absorption characteristics, the density resolution ability is limited, and it is difficult to accurately distinguish different materials. For example, in the early diagnosis of tumors, the detection sensitivity is low due to the close density of diseased tissue and normal tissue. X-ray Phase-Contrast Imaging (XPCI) can solve the above problems, giving higher image contrast and clearer object details. [0003] As an electromagnetic wave, X-rays will not only at...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/041G01N23/046
CPCG01N23/041G01N23/046G01N2223/03G01N2223/1016
Inventor 张催潘小东李公平商宏杰
Owner LANZHOU UNIVERSITY