Laser triangulation thickness measuring instrument and method based on side focal line method
A technology of laser triangulation and thickness gauge, which is applied to instruments, measuring devices, optical devices, etc., can solve the problems of large measurement errors, inaccurate measurements, collisions and scratches, and achieve the effect of small errors and accurate measurement results.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0029] Such as figure 1 As shown, a side focal line method laser triangulation thickness gauge provided by an embodiment of the present invention includes a transmitting unit and a receiving unit, wherein the transmitting unit includes a first transmitting component and a second transmitting component, and the first transmitting component during measurement and the second emitting component are...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


