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Bent glass subsurface defect detection method based on dark-field illumination

A curved glass and dark-field lighting technology, applied in the field of visual inspection, can solve the problems of low efficiency and achieve the effects of improving detection efficiency, simplifying operation, and improving contrast

Inactive Publication Date: 2019-07-23
HUAZHONG UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Aiming at the defects of the prior art, the purpose of the present invention is to provide a detection method for subsurface defects of curved glass based on dark-field illumination, aiming to solve the problem of low efficiency caused by the prior detection technology relying on manual experience and subjective observation

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  • Bent glass subsurface defect detection method based on dark-field illumination
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Embodiment Construction

[0047]In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute conflicts with each other.

[0048] The present invention provides a method for detecting subsurface defects of curved glass based on dark-field illumination, such as figure 1 As shown, the laser light source 1 emits a beam of laser light, which is vertically incident on the front light-passing surface of the polarizing beam splitter 2. After passing through the polarizing beam splitter 2, it is divided into two beams of P wa...

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Abstract

The invention discloses a bent glass subsurface defect detection method based on dark-field illumination. The method comprises the following steps: vertically irradiating a polarizing prism via the laser generated by a laser light source to obtain a P wave and a S wave, in which emitting directions thereof are vertical to each other; shielding the S wave, irradiating the bent glass to be tested via the P wave after beam expansion, wherein the light of the P wave generating total internal reflection in the bent glass to be tested forms a standing wave with the P wave to perform first time dark-field illumination on the bent glass to be tested; focusing a subsurface of the bent glass to be tested under the first time illumination, adjusting the incidence direction of the P wave according toa focused image, and fixing the P wave; shielding the P wave, making the light path of the S wave coincide with that of the P wave, irradiating the bent glass to be tested via the S wave after beam expansion, wherein the light of the S wave generating total internal reflection in the bent glass to be tested forms a standing wave with the S wave to perform second time dark-field illumination on thebent glass to be tested; and collecting an image containing a bent glass surface defect under the second time illumination. According to the bent glass subsurface defect detection method disclosed bythe invention, twice illumination is performed to perform non-destructive detection on defects in the bent glass, and the detection efficiency and the detection contrast are improved.

Description

technical field [0001] The invention belongs to the technical field of visual inspection, and more specifically relates to a detection method for subsurface defects of curved glass based on dark field illumination. Background technique [0002] As a non-metallic material with high smoothness, glass has a wide range of applications, but it is very easy to cause damage during production and processing, not only surface damage, but also internal damage has a great impact on the service life of the material . [0003] The detection methods of internal damage are usually divided into destructive measurement and non-destructive measurement. In recent years, due to the rapid development of computer technology, non-destructive measurement has been widely used due to its non-contact, non-destructive, repeatable and many other advantages. At present, the existing non-destructive measurement technology is mostly used in the internal defect detection of planar objects, and there is les...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/958G01N21/01
CPCG01N21/01G01N21/958G01N2021/0112
Inventor 夏珉唐世镇刘行思夏楠卿刘念
Owner HUAZHONG UNIV OF SCI & TECH
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