Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Defectoscope and mobile flaw detection source monitoring and management system formed by the defectoscope

A flaw detector, power management module technology, applied in manufacturing computing systems, radio wave measurement systems, satellite radio beacon positioning systems and other directions, can solve problems such as loss, flaw detectors are easily stolen, etc.

Pending Publication Date: 2019-08-02
SHANGHAI ERGONOMICS DETECTING INSTR
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problems existing in the prior art, the purpose of the present invention is to provide a flaw detector that can locate the flaw detector and solve the problem that the flaw detector is easy to be stolen or lost during operation.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Defectoscope and mobile flaw detection source monitoring and management system formed by the defectoscope
  • Defectoscope and mobile flaw detection source monitoring and management system formed by the defectoscope
  • Defectoscope and mobile flaw detection source monitoring and management system formed by the defectoscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] The technical solution provided by the present invention will be further described in detail in conjunction with the accompanying drawings and embodiments.

[0030] In order to solve the problem that the existing flaw detector is easy to be stolen and lost during transportation, storage and operation, the present invention provides a flaw detector with positioning function, such as Figure 1-4 As shown, the flaw detector provided by the present invention includes a housing 1 and a base 2 installed at the bottom of the housing 1. The housing 1 is provided with a radiation source outlet 11, a safety lock 12 and an automatic safety switch 13. The inside of the housing 1 Installed with uranium 14 and radioactive source 15. Such as Figure 5 As shown, the base 2 of the flaw detector includes a radiation detection module for judging whether the flaw detection source is in the flaw detector, a communication module for positioning and data information transmission, and a radia...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a defectoscope and a mobile flaw detection source monitoring and management system formed by the defectoscope. The defectoscope comprises a radiation detecting module, a communication module used for positioning and data information transmission, a main control module, and a power supply management module. An output signal of the radiation detecting module is input into themain control module. The main control module and the communication module are communicated and connected. The power supply management module is communicated and connected to the main control module,and provides a work voltage for the radiation detecting module, the communication module and the main control module. The defectoscope is integrated with the communication module with functions of positioning and data information transmission, positioning information can be uploaded to a monitoring terminal in a monitoring center so that monitoring personnel can monitor a position state of the defectoscope, and a problem that the defectoscope is easy to be stolen and lost during working is solved.

Description

technical field [0001] The invention relates to a flaw detector and a mobile flaw detection source monitoring and management system composed of it. Background technique [0002] Radiographic flaw detector (referred to as flaw detector) is a device that uses ray non-destructive testing methods to detect internal defects in materials, components or equipment. The principle of the ray flaw detector is that the radiation emitted by the radioactive source is weakened when it penetrates the object to be inspected. The degree of attenuation of the radiation is different in the defective part of the object and other parts of the object. According to this principle, the radiation of welding, castings, etc. Defects in the inspection object are visualized to determine their location, size, shape and type. Radiography has been widely used in the internal quality inspection of welds and castings, such as welds of various pressure vessels, boilers, hulls, oil and gas pipelines, various c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/02G01S19/48G06Q10/00G06Q50/04H02M3/06H04W64/00
CPCG01N23/02G01S19/48H02M3/06G06Q10/20G06Q50/04H04W64/00Y02P90/30
Inventor 张志勇李晨刘思平
Owner SHANGHAI ERGONOMICS DETECTING INSTR
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com