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System containing high-speed photoelectric encoder and test method

A photoelectric encoder, high-speed technology, applied in the field of photoelectric encoder, can solve the problems of slow response speed, large chip area, complex photoelectric encoder circuit, etc., and achieve the effect of fast response speed, simple circuit, and small chip area

Active Publication Date: 2019-08-06
SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The photoelectric encoder with this structure has the disadvantages of complex circuit, large chip area, and slow response speed, and is not suitable for high-speed measurement

Method used

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  • System containing high-speed photoelectric encoder and test method
  • System containing high-speed photoelectric encoder and test method
  • System containing high-speed photoelectric encoder and test method

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038] The above-mentioned high-speed photoelectric encoder of the present invention is in order to test the rotating speed of code disc, therefore, a kind of system of testing code disc rotational speed among the present invention comprises above-mentioned high-speed photoelectric encoder, code disc 2 and light source 1, and code disc 2 comprises alternating Translucent grating and opaque grating, the light source is located above the code disc, and the high-speed photoelectric encoder is located below the code disc. When the photosensitive area I of the first high-speed photosensitive module is located under the transparent grating, the photosensitive area of ​​the second high-speed photosensitive module Area II is located under the light-transmitting grating; when the light-sensing area I of the first high-speed photosensitive module is located under the light-impermeable grating, the light-sensing area II of the second high-speed photosensitive module is located under the li...

Embodiment 2

[0045] Please refer to the attached Figure 6 The above-mentioned high-speed photoelectric encoder of the present invention is in order to test the rotating speed of code wheel and turn to, therefore, a kind of system of testing code wheel rotating speed and turning to in the present invention, comprises code wheel 2, light source 1 and two above-mentioned high-speed photoelectric encoders , the code wheel 2 includes alternate light-transmitting gratings and opaque gratings, and the light source is located above the code wheel. Two high-speed photoelectric encoders are adjacently arranged below the code wheel. When the single photon When the avalanche diode Ⅰ is located under the light-transmitting grating, the single-photon avalanche diode Ⅱ is located under the opaque grating; Below the translucent grating. Similar to Embodiment 1, it is necessary to avoid simultaneous light transmission or opacity of the single photon avalanche diode I and the single photon avalanche diode...

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Abstract

Provided in the invention is a high-speed photoelectric encoder comprising a first high-speed photosensitive module, a second high-speed photosensitive module, and a D trigger. The output terminal ofthe first high-speed photosensitive module is connected to a clock input terminal of the D trigger; the output terminal of the second high-speed photosensitive module is connected to a reset input terminal of the D trigger; a data input terminal of the D trigger is connected to a high level; and the output terminal of the D trigger outputs a coding signal. According to the invention, with a singlephoton avalanche diode as a detecting component, the high-speed photoelectric encoder has advantages of fast response speed, simple circuit, small chip area and the like; and the rotating speed and rotating direction of the code disk can be measured rapidly and accurately.

Description

technical field [0001] The invention relates to the field of photoelectric encoders, in particular to a system containing a high-speed photoelectric encoder and a testing method. Background technique [0002] In industrial equipment and civil electrical equipment, the general workpiece speed measurement is realized through the cooperation of a photoelectric encoder, a code disc and a light source. The encoder obtains the rotational speed information of the code disc by detecting the light and dark frequency of the light irradiated on the chip through the code disc. [0003] At present, most photoelectric encoder chip products use bipolar junction transistor technology. The chip uses multiple photodiodes to monitor the light and dark changes of the incident light passing through the code disc. The integral is converted into a voltage, and then several voltage signals are compared to output a pulse signal. The photoelectric encoder with this structure has the disadvantages o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01P3/36G01P13/04
CPCG01P3/36G01P13/045
Inventor 段杰斌李琛蒋宇沈灵
Owner SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT