Array substrate detection key and display panel thereof
An array substrate and semiconductor technology, which is applied in the direction of electrical components, electric solid devices, circuits, etc., can solve the problems of array substrate detection keys being damaged and unable to be used for monitoring, etc., to reduce the potential difference, reduce the probability of electrostatic damage, increase The effect of large resistance
Inactive Publication Date: 2019-08-09
WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
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Problems solved by technology
[0006] The object of the present invention is to provide an array substrate detection key and a display panel, which solves the technical problem that the detection key is weak against static electricity, which causes the array substrate detection key to be damaged and cannot be used for monitoring, and ensures that the array substrate detection key normal test
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[0029] In describing the present invention, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", " Orientation indicated by rear, left, right, vertical, horizontal, top, bottom, inside, outside, clockwise, counterclockwise, etc. The positional relationship is based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, Therefore, it should not be construed as limiting the invention. In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, a feature...
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Abstract
The invention provides an array substrate detection key and a display panel thereof. The array substrate detection key includes a glass substrate, multiple buffer layers, a gate insulating layer, a gate layer, a source / drain electrode layer, an indium tin oxide layer, and a flat organic layer in this order from bottom to top, wherein the array substrate detection key further includes a semiconductor layer between the multiple buffer layers and the gate insulating layer and capable of absorbing a portion of static electricity to consume electrical energy to prevent the array substrate detectionkey from being damaged. The display panel includes the array substrate detection key. By means of the semiconductor layer, the resistance of the array substrate detection key can be increased, and the influence of slight electrostatic discharge (ESD) can be prevented in time. The semiconductor layer can absorb the slight electrostatic discharge (ESD) in the manufacturing process of the array substrate and consume electrical energy, namely the semiconductor layer acts as a resistor to reduce a potential difference, thereby reducing the probability of electrostatic damage and further reducing the risk of damaging the array substrate detection key.
Description
technical field [0001] The invention relates to the display field, in particular to an array substrate detection key and a display panel. Background technique [0002] The existing method for monitoring the electrical properties of the array substrate is to manufacture the test key (Test Key) in the test element group (Test Element Group, TEG) at the periphery of the array substrate at the same time as the array substrate is fabricated, by applying a voltage to the array substrate, and Measure the square resistance at the detection key, divide the voltage value by the resistance value to get the current value, and then detect the current value change curve of the array substrate. Through comparative analysis, the uniformity and other characteristics of the array substrate can be obtained, and then the array substrate can be understood. quality. [0003] see figure 1 As shown, it is a plan view of the existing array substrate detection key. The array substrate detection key...
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Login to View More IPC IPC(8): H01L27/12
CPCH01L27/1214
Inventor 谭刚贺超
Owner WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD