Binary signal generator

Abstract

A binary signal generator circuit (150) includes a programmable waveform generator (PWG) (155) having an input stage (210) for receiving a digital data stream, a serial clock signal for controlling receipt of the digital data, a frequency synchronization and a clock signal. The PWG includes registers (220) including a first and second register for storing bits representing a first frequency (f1) and for storing bits representing a zero frequency (fo), respectively. A MUX (260) receives a control signal based on the digital data for toggling between bits representing f1 and fo coupled to a digital-to-analog converter (DAC) (270) with an output providing a modulated signal that toggles between essentially f1 and essentially fo. A differential output amplifier (160) receives the modulated signal for generating a first and second amplified signal modulated between essentially f1 and essentially fo. The first and second amplified signals are phase shifted relative to one another, taken together providing a differential signal.

Description

Technical field [0001] The disclosed embodiments relate to binary signal generators, such as for binary state testing of semiconductor circuits performed by automatic test equipment (ATE). Background technique [0002] The binary state used for ATE digital testing of semiconductor circuits is usually achieved by forcing a difference in voltage level to indicate whether the current state is "0" or "1". Most digital ATE systems generate and / or acquire patterns of ones and zeros to excite the device under test (DUT) for digital testing. However, with the latest innovations in digital components, these systems often involve more complex digital testers that have capabilities beyond simple logic analyzers that have only two voltage states that are only on and off. ATE can provide programmable voltage levels, such as ten (10) or more states between -2.0V to 5.5V, to create flexibility that can be interfaced with multiple logic series or to characterize the upper and lower operating ra...

AI Technical Summary

Problems solved by technology

However, with recent innovations in digital parts, these systems often involve more complex digital testers with capabilities beyond a simple logic analyzer that has only two voltage states of ON and OFF states

Images