Test streamlining method and system based on testability influence cone for single stuck fault

Abstract

The invention provides a test simplification method and system for a single fixing type fault on the basis of a testability influence cone, and obtains the ST fault set of a target fault point f froma single fixing type fault point set. The method comprises the following steps that: obtaining the influence cone of the fault point in the single fixing type fault point set; extracting a fault pointf1 from the single fixing type fault point set; if the testability influence cone of the fault point f1 and the testability influence cone of the target fault point f do not intersect, obtaining a formula ST-STU{f1}; traversing the fault points in the single fixing type fault point set to form a ST fault set; and obtaining the test set of the single fixing type faults of a circuit to be detected,and carrying out dynamic and static test simplification on the test set. On the basis of circuit structure analysis and fault point testability influence cone calculation, a designed fault model testvector simplification method shortens vector generation time so as to reduce test data capacity and test time, and single fixing type digital integrated circuit testing efficiency is improved.

Description

technical field [0001] The technical field of electronic integrated circuits of the present invention, in particular, relates to a test simplification method and system for a single fixed fault based on a testability influence cone. Background technique [0002] The purpose of digital integrated circuit testing is to eliminate chips with manufacturing defects, improve the fault coverage of digital integrated circuit testing, improve the testing accuracy of integrated circuits, and improve the testing efficiency of integrated circuits. It is a crucial link in the chip development process. At the same time, it is also a powerful guarantee to ensure chip quality and market competitiveness. [0003] At present, in the field of integrated digital testing, there are mainly two types of faults: single stuck faults and transition delay faults, since single stuck faults can cover more than 70% of digital CMOS circuit faults, thus, in the current integrated circuit chip test , the si...

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Problems solved by technology

[0005] The embodiment of the present invention provides a test simplification method and system based on the testability influence cone for a single fixed fault, which is used to solve the problem that the number of test vectors and test data are cumbersome and occupy CPU time in the digital integrated circuit detection process in the prior art lack of length

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