Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Ultrashort laser pulse multipath delay synchronous testing method

A technology for multi-channel delay and synchronization testing, which can be used in instruments and other directions to solve problems such as low synchronization accuracy

Active Publication Date: 2019-09-13
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
View PDF7 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The invention solves the problem of low synchronization accuracy of the oscilloscope in the past, is more accurate than the previous spectrum analysis method, has a larger range of accurate measurement, and can simultaneously measure the delay difference of multiple paths

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Ultrashort laser pulse multipath delay synchronous testing method
  • Ultrashort laser pulse multipath delay synchronous testing method
  • Ultrashort laser pulse multipath delay synchronous testing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0082] Such as image 3 As shown, the schematic diagram of Embodiment 1 of the ultrashort pulse time-delay synchronous detection and control device of the present invention, in the figure, a 50:50 polarization maintaining beam combiner 1, an online polarizer 2, a spectrometer 3, a data processing PC4, and a 50:50 polarization maintaining beam splitter 5, calibration delayer 6.1, calibration fiber 6.2, mode-locked laser 14. 50:50 polarization maintaining beam combiner 1, 50:50 polarization maintaining beam splitter 5, and the pigtail length of calibration delayer 6.1 are about 1m. The entire setup uses polarization maintaining fiber. The central wavelength of the mode-locked laser 14 is about 1563nm, and the spectral half-maximum width is about 6nm. The length of the calibration optical fiber 6.2 is about 2m, so that the delay difference between the two paths is small, which is in line with the use of the present invention. The delay adjustment range of calibration delayer 6...

Embodiment 2

[0087] Such as Figure 6 As shown, without connecting the synchronous delayers 7.1, 7.2, 7.3, 7.4 first, the 14 pulses of the mode-locked laser pass through the beam splitter 5 and enter the calibration delayers 6.1, 6.2, 6.3, 6.4, calibration delayers 6.1, 6.2, 6.3, 6.4 Connect the beam combiner 1, the ultra-short laser beams pass through the polarizer 2 and then enter the spectrometer 3. The data accuracy is 0.13nm, and the number of points after expansion is 2 18 . Control the calibration delays 6.1, 6.2, 6.3, 6.4 and adjust the delays from small to large, and the delay difference between the calibration delay 6.1 and the calibration delay 6.4 is greater than that of the calibration delay 6.1 and the calibration delay 6.3 Twice of the delay difference; the spectrometer 3 image data is imported into PC4, and the data is processed as in step 2, the result is as shown in Figure 7 (a), the delay between calibration delayer 6.1 and calibration delayer 6.2,6.3,6.4 The time dif...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an ultrashort laser pulse multipath delay synchronous testing method. A measuring and control device comprises an ultrashort pulse laser device, a beam combiner, an online polarizer, a spectrometer, a computer, a beam splitter, n check delayers, n synchronous delayers, and a n to-be-tested light paths; spectrum interferograms of multiple to-be-tested light paths can be acquired through the spectrometer, the spectrometer data is imported into the computer to process so as to obtain precise delay residual quantity. Through the testing method disclosed by the invention, the single signal can be detected, or the delay change condition of the laser signal with a certain repetition frequency can be detected, the high-precision delay residual quantity can be acquired, andthe closed-loop control can be realized.

Description

technical field [0001] The invention relates to an ultrashort laser, in particular to an ultrashort laser pulse multi-path delay synchronous testing method. Background technique [0002] In the large laser device of inertial confinement nuclear fusion, in order to satisfy the Lawson condition, it is necessary to bombard the target pellet with great energy in a very short time. This requires that the multi-channel and multi-stage amplified lasers reach the target ball as much as possible at the same time, and the time synchronization of each laser has a direct impact on the performance of the device and the results of the experiment. Therefore, it is necessary to perform high-precision detection and control on the delay synchronization of each pulse. [0003] In the past, in the synchronous test of high-power laser devices, the American NOVA device set up Pickoff mirror sampling before the beam reached the target chamber, and used a streak camera to measure the difference be...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
CPCG01J11/00
Inventor 范薇祁许昊黄大杰汪小超张生佳
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products