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Measurement device and measurement method

A technology for measuring devices and measuring methods, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problem of not forming a component holding part, etc., and achieve the effect of large surface resistance

Active Publication Date: 2019-09-20
FUJI KK
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In Patent Document 2, there is no description about the material forming the element holding portion

Method used

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  • Measurement device and measurement method
  • Measurement device and measurement method
  • Measurement device and measurement method

Examples

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Embodiment Construction

[0021] Hereinafter, the mounting machine including the measuring device according to one embodiment of the present disclosure will be described in detail based on the drawings. In this measurement device, the measurement method according to one embodiment of the present disclosure is carried out.

[0022] figure 1 The shown mounting machine has a structure for mounting components on a circuit board, and includes a device main body 2, a circuit board transport and holding device 4, a component supply device 6, a head moving device 8, and the like.

[0023] The circuit substrate transfer and holding device 4 is a structure for transferring and holding a circuit substrate P (hereinafter, simply referred to as a substrate P). figure 1 Here, the transport direction of the substrate P is defined as the x direction, the width direction of the substrate P is defined as the y direction, and the thickness direction of the substrate P is defined as the z direction. The y direction and ...

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PUM

PropertyMeasurementUnit
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Abstract

The present invention makes it possible to satisfactorily measure electrical properties with a measurement device even if a component is small. In this measurement device, at least a portion of a component holding portion is established as an antistatic portion formed from an antistatic material. Since the sheet resistance of the antistatic portion is high, it is possible to measure the electrical properties of a component while the component is held by the antistatic portion. As a result, even if the component is small, it is possible satisfactorily measure the electrical properties of the component while preventing the component from being dispersed.

Description

technical field [0001] The present disclosure relates to a measurement device for measuring electrical characteristics of components mounted on a circuit board, and a method for measuring electrical characteristics of components. Background technique [0002] Patent Documents 1 and 2 describe a measuring device including a holding table provided with an element holding portion for holding an element, and a pair of measuring elements arranged so as to be able to approach or separate from each other and to hold the element and to hold the element. Ability to measure electrical characteristics. In the measuring device described in Patent Document 1 among them, the element holding part is formed of a material having conductivity. Therefore, after the component held by the component holding unit is gripped by the pair of measuring pieces, the component holding unit (holding table) is separated from the component, and the electrical characteristics of the component are measured i...

Claims

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Application Information

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IPC IPC(8): H05K13/08G01R31/00
CPCH05K13/082G01R31/2893H05K13/0409G01R31/2808
Inventor 泽田利幸
Owner FUJI KK