Opto-electronic measuring device with scan functionality and opto-electronic measuring method

Abstract

An opto-electronic measuring device with scan functionality and an opto-electronic measuring method. The optoelectronic measuring device having scanning functionality includes a pulsed radiation source for generating a measuring beam from light pulses at a light pulse emission rate, an optoelectronic detector for detecting light pulses reflected from a target object, a control and analysis unit designed for measuring a distance value from a respective scanning point of the target object according to the time-of-flight principle, based on a number n>=1 of light pulses, wherein the control and analysis unit is designed to automatically set the number (n) depending on a target-object-related measured value determined by the measuring device in real time.

Description

technical field [0001] The invention relates to a photoelectric measuring device and a photoelectric measuring method with scanning function. Background technique [0002] Various forms of optoelectronic measuring devices with scanning functionality are known, with which the position is determined on the basis of optical radiation. Examples are geodetic surveying devices such as total stations or multistations for measuring and / or generating 3D coordinates of surfaces, for example total stations such as Leica P20 or Leica Multistation 50, laser trackers, or profilometers and Laser scanners, or laser scanners for geodetic or industrial surveying purposes. 3D scanning is a very efficient technique for generating millions of spatial measurement points of an object within minutes or seconds. Typical measurement tasks are to document objects such as gears, wings, ships or aircraft and / or their surfaces, or objects such as industrial plants, house facades, or historic buildings,...

AI Technical Summary

Problems solved by technology

If relatively many light pulses and thus relatively many points are combined during one scan, this enables, for example, usable measurements or scan points to be obtained from weakly reflective targets, however, this produces at most a sufficiently dense scan grid

In contrast, for the case of more distant objects, the scan points are then "missing" and / or only provide a very wide mesh scan grid, and the position resolution is too low to satisfactorily obtain the corresponding object's geometry

Conversely, with scanning with analysis (e.g., each individual light pulse ("single shot")), it is also possible to scan more distant objects with good enough resolution, however, the mentioned problem of poor SNR is again Occurrence, for example, of a strong background signal or poorly reflective target objects in the scan range

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