Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Detection device, evaporation system and detection method

A detection device and evaporation technology, applied in measuring devices, electromagnetic measuring devices, electrical devices, etc., can solve the problems of affecting the pressing effect, affecting the evaporation effect of the substrate to be evaporated, and affecting the display effect of the display panel. Achieve the effects of reducing losses, avoiding waste, and improving production efficiency

Inactive Publication Date: 2019-10-08
YUNGU GUAN TECH CO LTD
View PDF4 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The evaporation of the substrate of the display panel is usually carried out in a vacuum evaporation chamber. During the evaporation process, the substrate to be evaporated and the mask plate need to be aligned and pressed through the magnetic plate. If the substrate is attached to the surface of the magnetic plate Unevenness will affect the lamination effect, which will affect the evaporation effect of the substrate to be evaporated, and finally affect the display effect of the display panel

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Detection device, evaporation system and detection method
  • Detection device, evaporation system and detection method
  • Detection device, evaporation system and detection method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] Features and exemplary embodiments of various aspects of the invention will be described in detail below. In the following detailed description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced without some of these specific details. The following description of the embodiments is only to provide a better understanding of the present invention by showing examples of the present invention. In the drawings and the following description, at least some well-known structures and techniques have not been shown in order to avoid unnecessarily obscuring the present invention; and, for clarity, the dimensions of some structures may have been exaggerated. Furthermore, the features, structures, or characteristics described hereinafter may be combined in any suitable manner in one or more embodiments.

[0027] The orient...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention discloses a detection device, an evaporation system and a detection method. The detection device is used for detecting the flatness of a to-be-detected substrate in the evaporation process; an induction layer is included, and can be arranged on the surface of a magnetic plate so that the magnetic plate can be used for attracting a mask plate; in the pasting process of the mask plateand the to-be-detected substrate, the induction layer can be pasted to the to-be-detected substrate, and the induction layer can generate an induction signal according to the flatness of the surface,pasted to the induction layer, of the to-be-detected substrate. According to the detection device, when the surface, pasted to the induction layer, of the to-be-detected substrate is not flat, the induction layer can generate the induction signal; through the induction signal, whether the surface, pasted to the induction layer, of the to-be-detected substrate is flat or not can be judged, then when it is detected that the surface of the to-be-detected substrate is not flat, evaporation on the to-be-detected substrate can stop in time, and waste of an evaporation material is avoided.

Description

technical field [0001] The invention belongs to the field of display technology, and in particular relates to a detection device, an evaporation system and a detection method. Background technique [0002] The evaporation of the substrate of the display panel is usually carried out in a vacuum evaporation chamber. During the evaporation process, the substrate to be evaporated and the mask plate need to be aligned and pressed through the magnetic plate. If the substrate is attached to the surface of the magnetic plate Unevenness will affect the lamination effect, further affect the evaporation effect of the substrate to be evaporated, and finally affect the display effect of the display panel. [0003] Therefore, it is particularly important to detect the flatness of the surface of the substrate to be evaporated. Contents of the invention [0004] Embodiments of the present invention provide a detection device, a vapor deposition system and a detection method, aiming at de...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C23C14/04C23C14/24G01B7/34
CPCC23C14/042C23C14/24G01B7/34G01B7/345
Inventor 贾松霖陈营营
Owner YUNGU GUAN TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products