Image processing device, foreign object inspection device, image processing method and foreign object inspection method

An image processing device and image processing technology, applied in image data processing, image enhancement, image analysis and other directions, can solve problems such as accuracy reduction, and achieve the effect of high-precision foreign body inspection

Pending Publication Date: 2019-10-15
SUMITOMO CHEM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As a result, there is a problem that the accu

Method used

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  • Image processing device, foreign object inspection device, image processing method and foreign object inspection method
  • Image processing device, foreign object inspection device, image processing method and foreign object inspection method
  • Image processing device, foreign object inspection device, image processing method and foreign object inspection method

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Embodiment Construction

[0052] figure 1 It is a figure which shows the schematic structure of the foreign object inspection apparatus 100 which concerns on one aspect of this invention. figure 2 is a plan view of the main surface 31 of the image sensor 3 .

[0053] The foreign object inspection device 100 detects a foreign object 13 adhering to the inspection object 1 . The inspection object 1 is a separator roll body in which a separator 12 for a non-aqueous electrolyte secondary battery is wound around a core body 11 . Wherein, the inspection object 1 may also be an object formed by winding a thin film around the core body 11 other than the separator 12 for a non-aqueous electrolyte secondary battery, or may not be an object formed by winding a thin film around the core body 11. thing. The foreign matter inspection device 100 includes an electromagnetic wave generator 2 , an image sensor 3 , and an image processing device 4 .

[0054] The electromagnetic wave generator 2 irradiates electromagn...

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PUM

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Abstract

The invention provides an image processing device, a foreign object inspection device, an image processing method and a foreign object inspection method. The image processing device is capable of high-accuracy foreign object inspection. The image processing device include a background value setting section configured to (i) obtain a value for use as a background value on a basis of a first pixel value of at least one reference pixel present in the vicinity of a target pixel and having a predetermined positional relationship with the target pixel, and (ii) set the background value of the targetpixel to the value obtained.

Description

technical field [0001] The present invention relates to an image processing device, a foreign matter inspection device, an image processing method, and a foreign matter inspection method. Background technique [0002] Nonaqueous electrolyte secondary batteries such as lithium ion secondary batteries are widely used as batteries for personal computers, mobile phones, portable information terminals, and the like. In particular, lithium-ion secondary batteries are used to reduce CO as compared to conventional secondary batteries. 2 Attention is paid to batteries that discharge less and help save energy. [0003] Conventionally, development of a separator wound body in which a separator for a non-aqueous electrolyte secondary battery is wound around a core body has been underway. In addition, studies are being made on foreign matter inspection for detecting foreign matter adhering to the separator wound body. [0004] As an example of an inspection that can be applied to the ...

Claims

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Application Information

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IPC IPC(8): G01N23/04G01N23/16G01N23/18G06V10/56
CPCG01N23/18G01N23/16G01N23/04H04N5/32G06T7/001G06T2207/30108G06T7/254G06V10/467G06V10/56G01N23/043G01N21/892G01N21/94G06T7/0004G01N2223/1016G01N2223/652G06T7/73G06T7/0002G06T7/194H04N23/80H04N25/40H04N25/771
Inventor 加集功士
Owner SUMITOMO CHEM CO LTD
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