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Sensing memory cell

A memory unit, storage logic technology, applied in static memory, digital memory information, information storage and other directions

Inactive Publication Date: 2019-11-01
MICRON TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

FeRAM can use a device architecture similar to volatile memory, but can have non-volatile properties due to the use of ferroelectric capacitors as storage devices

Method used

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Examples

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Embodiment Construction

[0019] In some memory devices, the amount of charge that a memory cell exchanges with other components during a read operation can be used to determine whether the memory cell stores a first logic state or a second logic state. Differences in the amount of charge (Q) required by a memory cell during a read operation based on the logic state stored on the memory cell can affect the sensing window of the memory cell. For example, the sensing window during a read operation can be based on a difference in the amount of charge to detect a first logic state and a second logic state. In some memory devices, the change in voltage associated with charge during a read operation can be linear or nearly linear. However, in other memory devices, the characteristics of the memory device may be configured such that the change in voltage associated with charge during a read operation may be non-linear during a read operation. This change can increase the size of the sensing window and can ge...

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Abstract

Devices and methods for sensing a memory cell are described. The memory cell may include a ferroelectric memory cell. During a read operation, a cascode may couple a precharged capacitor with the memory cell to transfer a charge between the precharged capacitor and the memory cell. The cascode may isolate the capacitor from the memory cell based on the charge transferred between the capacitor andthe memory cell. A second capacitor (e.g., a parasitic capacitor) may continue to provide an additional amount of charge to the memory cell during the read operation. Such a change in capacitance value during the read operation may provide a large sense window due to a non-linear voltage characteristics associated with the change in capacitance value.

Description

[0001] cross reference [0002] This patent application claims priority to U.S. Patent Application Serial No. 15 / 962,941, filed April 25, 2018, by Di Vincenzo, entitled "SENSING A MEMORY CELL," Said US patent application is assigned to the present assignee and is expressly incorporated herein by reference in its entirety. technical field [0003] The technical field relates to sensing memory cells. Background technique [0004] The following relates generally to operating memory arrays, and more specifically to sensing memory cells. [0005] Memory devices are widely used to store information in a variety of electronic devices such as computers, wireless communication devices, cameras, digital displays, and the like. Information is stored by programming different states of the memory device. For example, a binary device has two states, usually designated as a logic "1" or a logic "0." In other systems, more than two states may be stored. To access stored information, c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C11/22
CPCG11C11/2273G11C11/221G11C11/2293G11C5/025G11C7/067G11C7/065G11C11/2255G11C11/2275G11C11/2257G11C11/22G11C11/24
Inventor U·迪温琴佐
Owner MICRON TECH INC
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