Full-electronic terahertz tomography device and control method thereof

Abstract

The invention discloses a full-electronic terahertz tomography device and a control method thereof. The full-electronic terahertz tomography device comprises a dual-path microwave signal source for generating a path of radio frequency microwave signals and a path of local oscillator microwave signals, a multi-channel spread spectrum module for seperately expanding one path of radio frequency microwave signals and one path of local oscillator microwave signals into N paths of radio frequency microwave signals and N paths of local oscillator microwave signals and generating one path of referenceintermediate-frequency signals, a multi-transmitting multi-receiving terahertz annular array for respectively carrying out frequency multiplication and amplification on N paths of radio frequency microwave signals and N paths of local oscillator microwave signals to generate N paths of terahertz transmitting signals and N paths of terahertz local oscillator signals, and mixing the N paths of terahertz local oscillator signals with scattering signals of N paths of tested samples to obtain N paths of testing intermediate-frequency signals, a multi-channel synchronous acquisition unit for acquiring N paths of testing intermediate-frequency signals and a path of reference intermediate-frequency signals, and a master control computer acquiring and processing the scattering data of a tested sample and realizing high-resolution imaging of the tested sample through a contrast source algorithm.

Description

technical field [0001] The present disclosure relates to the technical field of terahertz imaging, in particular to an all-electronic terahertz tomography device and a control method thereof. Background technique [0002] Terahertz waves are located between microwaves and infrared rays, and have physical properties such as no ionizing radiation, high resolution, harmlessness to the human body, and strong penetrability. Terahertz imaging can obtain images of the spatial density distribution of substances, so terahertz imaging is especially suitable for applications such as internal structure measurement and defect imaging of materials that are invisible to visible light and have insufficient X-ray contrast. Compared with ultrasonic waves, terahertz waves have small attenuation, deep penetration, and short wavelength in the tested sample, and can obtain high-resolution imaging effects, which can visually display internal defects; compared with X-rays, it will not be destroyed ...

AI Technical Summary

Problems solved by technology

[0003] For terahertz imaging, the inventor found in the research and development process that the current common method is to install the terahertz transceiver module or the sample under test on a mechanical motion device for scanning. This method is simple in structure, but the test efficiency is low. In addition, because only Using the reflection or transmission information of the measured sample, theoretically only half the theoretical resolution of the wavelength can be obtained

Images