Automatic testing method and system for comprehensive test instrument

Abstract

The invention provides an automatic test method and an automatic test system for a comprehensive test instrument. The method comprises the following steps: S1, setting test parameters, and configuringtest contents; S2, reading test parameters of the tested equipment in parallel through the first comprehensive tester and the second comprehensive tester, and capturing and analyzing WLAN signals sent by the tested equipment to obtain test index data; and S3, respectively obtaining test results of the first comprehensive tester and the second comprehensive tester through API interfaces, and thendisplaying the test results in a list mode. According to the invention, the test efficiency can be effectively improved. One WLAN type tested device can be completed only in about 2 hours after the automatic test is realized. The mistaken testing can be prevented, and the automatic test result output is realized. The comparison precision can be effectively improved. Signals are captured and analyzed through the first comprehensive tester and the second comprehensive tester which are parallel to each other. The time delay is eliminated, and the result is more consistent and effective. The operation is simple, and testers can easily master.

Description

technical field [0001] The invention relates to a comprehensive tester testing method, in particular to a comprehensive tester automatic test method, and to an comprehensive tester automatic test system using the comprehensive tester automatic test method. Background technique [0002] A comprehensive tester, such as a WLAN comprehensive tester, requires a combination of software and hardware to use the system. To test the TX scheme (transmission scheme) of the device under test (DUT), all signals are analyzed by the hardware and software of the WLAN comprehensive tester, and are transmitted through the software GUI interface. Present a lot of key indicator data, and then use these key indicator data to judge the quality of the device under test (DUT), and finally judge whether the device under test (DUT) meets the requirements for external release. [0003] The comprehensive tester test method in the prior art is mainly implemented in a manual manner, which mainly has the f...

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Problems solved by technology

[0003] The comprehensive tester test method in the prior art is mainly implemented in a manual manner, which mainly has the following defects and deficiencies: first, it is very time-consuming, and it is necessary to manually control the device under test (DUT) and manually Separately control the comprehensive testing instrument to collect and analyze, and then record a lot of relevant index data separately. This is just a round of testing process

In the process of this comparison experiment, many scenarios such as different parameters in the device under test (DUT), different parameters in the analysis options, etc. need to be traversed, and many rounds of test experiments are required, which shows the seriousness of time-consuming

[0004] Second, it is not accurate enough. The signal sent by the device under test (DUT) itself has certain instability, and manual testing, even if it is tested by two comprehensive testers, these two comprehensive testers are also time-sharing tests. If there is a certain time difference, the comparison of test data between the two cannot exclude the instability factor of the device under test (DUT) itself.

[0005] Third, it is easy to make mistakes. Since there is not only one index to be compared in the test experiment, there are many index data that need to be recorded manually. In addition, there are many scenarios and test types. It is easy for the staff to operate and record the data for a long time. go wrong

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