Large-area adjustable light source manual test base

Abstract

The invention discloses a large-area adjustable light source manual test base, comprising a base plate and a light shield arranged above the base plate, a moving sliding table is arranged on the baseplate by virtue of a sliding rail, a locating rod is arranged at the bottom of the moving sliding table, the locating rod is arranged at a loading locating seat and a test locating seat at the front and rear sides of the base plate and used for limiting position, the moving sliding table is provided with a test base combination by virtue of a frame body, a light box is also arranged on the base plate by virtue of a vertical sliding rail, the two sides of the light box are connected with the vertical sliding rail by virtue of a sliding seat, the top of the light box is connected with a micrometer head arranged on an end plate at the top side of the vertical sliding rail, and the light box is a large-area light box and covers a stroke region limited by the loading locating seat and the testlocating seat. The large-area adjustable light source manual test base disclosed by the invention is simple in structure, the large-area light box is independently arranged and also can be verticallyadjusted, light intensity, projected to a photosensitive area of a tested chip, of the light box can be adjusted, and light intensity uniformity of the light box is good; meanwhile, the manual test base is easy to operate in a testing process and has strong practicability.

Description

technical field [0001] The invention relates to the field of test bases, in particular to a large-area adjustable light source manual test base. Background technique [0002] The optical camera chip (CIS) and its camera module (CMOS) are widely used in industrial, medical and consumer fields. With the requirements of end users for image processing and the development of high-pixel image acquisition and analysis technology, this product has gradually replaced the original glass optical lens in many fields. [0003] The tens of millions of optical chip modules is a major development trend in the CIS and CMOS industries. At present, this kind of chip is mainly used in satellites, high-altitude reconnaissance aircraft and high-pixel smart cameras. With the product's packaging and testing process becoming more and more mature, the trend of application in high-definition cameras, surveillance cameras, mobile phone cameras and computer cameras will be unstoppable. [0004] In Chi...

AI Technical Summary

Problems solved by technology

[0007] In the prior art, the manual test clamshell socket with a light box has a light box on the upper cover. In this way, the intensity of the light box is determined by the initial structure of the light box. Replace the light box, and the area of ​​the light box is small, and the uniformity is not good enough

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