Method for measuring stray radiation of thermal infrared spectrometer

A technology of thermal infrared spectroscopy and stray radiation, applied in the field of quantitative testing of remote sensing instruments, can solve problems affecting system radiation accuracy and system quantification, and achieve the effect of strong engineering practical application value

Active Publication Date: 2019-11-19
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] The invention proposes a method for measuring stray radiation of a thermal infrared spectrometer, in order to solve the problem that in practical engineeri...

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  • Method for measuring stray radiation of thermal infrared spectrometer
  • Method for measuring stray radiation of thermal infrared spectrometer
  • Method for measuring stray radiation of thermal infrared spectrometer

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[0032] In order to make the purpose, features and advantages of the present invention clearer, a specific implementation of the present invention will be described in more detail below in conjunction with the accompanying drawings and embodiments. In the following description, many specific details are set forth. In order to fully understand the present invention, the present invention can be implemented in many other ways than described, therefore, the present invention is not limited by the specific embodiments disclosed below.

[0033] We take the thermal infrared spectrometer measuring the Offner structure as an example, the optical structure of the thermal infrared spectrometer is as follows image 3 Shown, according to the test method of the internal stray radiation of the thermal infrared spectrometer described in the present invention, a specific implementation is given.

[0034] Such as figure 1 As shown, connect the detector 2 with the thermal infrared spectrometer ...

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Abstract

The invention discloses a method for measuring stray radiation of a thermal infrared spectrometer. The method comprises the steps of connecting a detector and a to-be-measured thermal infrared spectrometer; measuring output response curves, received after the thermal infrared spectrometer carries out light splitting on radiation energy of a black body, of single spectral channel at different spectrometer temperature separately at same integration time; and calculating a radiation luminance response parameter of internal stray radiation of the thermal infrared spectrometer through a differencevalue, thereby quantifying an output gray value and radiation flux of the internal stray radiation of the thermal infrared spectrometer at any integration time and any spectrometer temperature. The method disclosed by the invention has universality at different spectral channels and different integration time and has great engineering practical application value, and the problem that system radiation accuracy and system quantification are seriously affected by internal stray radiation of the thermal infrared spectrometer can be effectively solved.

Description

technical field [0001] The invention relates to the field of quantitative testing of remote sensing instruments, in particular to a method for measuring stray radiation of a thermal infrared spectrometer. Background technique [0002] During the spectral splitting process of thermal infrared spectrometer, the signal light is divided into dozens to hundreds of bands. Due to the strong internal stray radiation generated by the radiation of the optical machine itself, the signal intensity is weaker than that of traditional imaging instruments, resulting in system signal noise. Ratio, the effective dynamic range is small, and the exposure time is difficult to increase; and the internal stray radiation increases with the increase of temperature, which seriously affects the system radiation accuracy and system quantification. Therefore, the measurement and calibration of the internal stray radiation of the thermal infrared spectrometer is particularly important for the research of...

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Application Information

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IPC IPC(8): G01J5/52G01J5/60
CPCG01J5/601G01J5/53
Inventor 刘银年彭俊柴孟阳孙德新杜浩霆许越殷自豪
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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