Fault Diagnosis Method of Analog Circuit Based on Fault Characteristic Area

Abstract

The invention discloses a method for diagnosing faults of analog circuits based on fault characteristic regions. Firstly, the fuzzy group analysis is performed on the analog circuit to obtain the information of each fuzzy group, and the representative components of each fuzzy group are respectively within the tolerance range of component parameter values. Set several component parameter vectors, obtain the boundary vector of the convex domain of the circle model parameter eigenvector range of each fuzzy group, use contour fitting to obtain the contour of the fault feature area of ​​each fuzzy group, and obtain the circle of the current analog circuit according to the degradation data during fault diagnosis Model parameters, to judge whether the circle model parameters are located in the fault feature area, so as to realize fault diagnosis. The invention can obtain the fault characteristic area of ​​the analog circuit under the influence of the tolerance, so as to realize the fault diagnosis.

Description

technical field [0001] The invention belongs to the technical field of fault diagnosis of analog circuits, and more specifically relates to a fault diagnosis method for analog circuits based on fault characteristic regions. Background technique [0002] With the rapid development of integrated circuits, in order to improve product performance, reduce chip area and cost, it is necessary to integrate digital and analog components on the same chip. According to data reports, although the analog part only accounts for 5% of the chip area, its fault diagnosis cost accounts for 95% of the total diagnostic cost. Analog circuit fault diagnosis has always been a "bottleneck" problem in the integrated circuit industry. At this stage, some well-developed analog circuit fault diagnosis theories have been applied to practice, such as: fault dictionary method in pre-test analog diagnosis method, component parameter identification method and fault verification method in post-test analog di...

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Problems solved by technology

However, these methods can only deal with discrete parametric faults and hard faults, and cannot fully diagnose continuous parametric faults of analog components.

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