Fault Diagnosis Method of Analog Circuit Based on Fault Characteristic Area

A technology for simulating circuit faults and fault characteristics, which is applied in the field of fault diagnosis of analog circuits based on fault feature areas, can solve problems such as incomplete diagnosis of continuous parameter faults of analog components, and achieve the effect of fault diagnosis

Active Publication Date: 2020-12-01
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, these methods can only deal with discrete parametric faults and hard faults, and cannot fully diagnose continuous parametric faults of analog components.

Method used

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  • Fault Diagnosis Method of Analog Circuit Based on Fault Characteristic Area
  • Fault Diagnosis Method of Analog Circuit Based on Fault Characteristic Area
  • Fault Diagnosis Method of Analog Circuit Based on Fault Characteristic Area

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Embodiment

[0036] In order to better illustrate the technical contents and invention points of the present invention, the theoretical derivation process of the present invention will be described first.

[0037] figure 1 is the analog circuit diagram. like figure 1 As shown, N represents a linear time-invariant circuit, which consists of an independent voltage source excitation. Indicates the output voltage phasor on the selected measuring point, and x is a passive component. According to the substitution theorem, the passive element x can be replaced by an independent voltage source with the same voltage across its terminals, resulting in an equivalent circuit. figure 2 Yes figure 1 Equivalent circuit diagram of the analog circuit shown. According to Thevenin's theorem, any active linear time-invariant port network can be equivalently replaced by a series branch of a voltage source and an impedance, so:

[0038]

[0039] in, Yes figure 2 Open-circuit voltage phasor of p...

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Abstract

The invention discloses a method for diagnosing faults of analog circuits based on fault characteristic regions. Firstly, the fuzzy group analysis is performed on the analog circuit to obtain the information of each fuzzy group, and the representative components of each fuzzy group are respectively within the tolerance range of component parameter values. Set several component parameter vectors, obtain the boundary vector of the convex domain of the circle model parameter eigenvector range of each fuzzy group, use contour fitting to obtain the contour of the fault feature area of ​​each fuzzy group, and obtain the circle of the current analog circuit according to the degradation data during fault diagnosis Model parameters, to judge whether the circle model parameters are located in the fault feature area, so as to realize fault diagnosis. The invention can obtain the fault characteristic area of ​​the analog circuit under the influence of the tolerance, so as to realize the fault diagnosis.

Description

technical field [0001] The invention belongs to the technical field of fault diagnosis of analog circuits, and more specifically relates to a fault diagnosis method for analog circuits based on fault characteristic regions. Background technique [0002] With the rapid development of integrated circuits, in order to improve product performance, reduce chip area and cost, it is necessary to integrate digital and analog components on the same chip. According to data reports, although the analog part only accounts for 5% of the chip area, its fault diagnosis cost accounts for 95% of the total diagnostic cost. Analog circuit fault diagnosis has always been a "bottleneck" problem in the integrated circuit industry. At this stage, some well-developed analog circuit fault diagnosis theories have been applied to practice, such as: fault dictionary method in pre-test analog diagnosis method, component parameter identification method and fault verification method in post-test analog di...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/316G06F30/36
CPCG01R31/316
Inventor 杨成林刘震周秀云
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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