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A tp scanning method applied to idc chips

A scanning method and chip technology, applied in the field of TP scanning, can solve problems such as large system noise and achieve the effect of improving SNR

Active Publication Date: 2021-03-26
合肥松豪电子科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The position of this part of an H_line is fixed. If the system suffers from white noise interference, TP cannot avoid it through frequency modulation, which will cause the noise of the entire system to be large.

Method used

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  • A tp scanning method applied to idc chips
  • A tp scanning method applied to idc chips
  • A tp scanning method applied to idc chips

Examples

Experimental program
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Embodiment Construction

[0015] In the IDC chip, the n-way Mux signals in DP are integrated into one signal, and sent to TP through DP, and DP will also send one signal TE to TP. When TE is high, it means that DP is in the display state; TE is low. When the level is high, it means that the display of DP on one H_line has been completed.

[0016] Traditional scanning modes such as figure 2 As shown, when TE is pulled high, TP scanning is not performed because it is in the DP frame area. When the falling edge of TE is collected, it means that the display of DP has been completed, and Mux will not switch again. At this time, the noise is relatively small, and the scanning time of TP starts. Before the arrival of the next H_line, TP completes scanning in the TP frame area, and transmits the analog signal collected by CA to ADC, ADC completes decoding and transmits the digital signal to CPU for calculation and processing. Depend on figure 2 It can be seen that the scanning time in the TP frame area is...

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Abstract

The invention provides a TP scanning method applied to an IDC chip, and the method comprises the steps: carrying out TP scanning in a DP frame region in the IDC chip; during TP scanning in the DP frame area, when an H _ line starts and a Source Driver is opened, performing TP scanning when the high level of Mux arrives; and after the primary TP scanning is finished, waiting for the arrival of thehigh level of the Mux, finishing the TP scanning in the high level area of the Mux, and carrying out new TP scanning. On the premise of overcoming Mux square wave noise, TP scanning is applied to a DPframe area, SNR of TP is improved, and a larger scanning frequency configurable range is provided to cope with white noise and other interferences. According to the invention, a brand-new scanning mode is developed, and unexpected beneficial effects are achieved.

Description

technical field [0001] The invention relates to the technical field of scanning, in particular to a TP scanning method applied to an IDC chip. Background technique [0002] The self-capacitive TP (touch panel, touch panel) panel is covered with numerous CB (base capacitor, base capacitor) capacitors. When a finger touches the panel, it will change the CB capacitance of the touch point on the panel. At this time, the AFE (analog front end, analog front end) combines the timing of the analog end to control the CA (charge amplifier, charge amplifier) ​​to collect analog quantities from the touch points on the TP panel. After sampling, the analog quantity collected by CA is converted into digital data through ADC (analog digital converter, analog-to-digital converter), and then transmitted to the digital part for CPU (Central Processing Unit, central processing unit) calculation and processing. [0003] In the IDC (integrated driver controller, integrated driver controller) chi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F3/041G06F3/044
CPCG06F3/0418G06F3/044
Inventor 黄俊钦杜洪洋
Owner 合肥松豪电子科技有限公司
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