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X-ray transmission device under strong magnetic field

A technology of transmission device and strong magnetic field, which is applied in the direction of measuring device, material analysis using radiation diffraction, material analysis using wave/particle radiation, etc. It can solve problems such as light intensity, human body influence, and failure to meet experimental requirements. Achieve radiation protection, reduce strength loss, and facilitate assembly and operation

Inactive Publication Date: 2019-11-26
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, X-rays attenuate rapidly in the air and propagate in the air for a long distance, which will cause the light intensity reaching the sample to be very weak, which cannot meet the experimental requirements; The human body is greatly affected

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  • X-ray transmission device under strong magnetic field
  • X-ray transmission device under strong magnetic field

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Embodiment Construction

[0020] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0021] Embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings, as figure 1 Shown is a schematic diagram of the overall structure of the X-ray transmission device under the strong magnetic field provided by the embodiment of the present invention. The device mainly includes a capillary optical lens 5 and a stainless steel vacuum pipeline 6, wherein:

[0022] The capillary optical ...

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Abstract

The invention discloses an X-ray transmission device under a strong magnetic field. The device comprises a capillary optical lens and a stainless steel vacuum pipeline. The capillary optical lens is connected with one end of the stainless steel vacuum pipeline. The capillary optical lens focuses X-rays emitted by a light source into approximately parallel light; and the approximately parallel light is transmitted in the stainless steel vacuum pipeline and can be transmitted to a sample position in a strong magnetic field environment. The stainless steel vacuum pipeline is provided with a vacuum meter and an extraction opening; the vacuum degree condition in the stainless steel vacuum pipeline is monitored through the vacuum meter; and the stainless steel vacuum pipeline is vacuumized through the extraction opening. Two ports of the stainless steel vacuum pipeline are connected with flanges respectively and beryllium windows are welded to the flanges. The two ports of the stainless steel vacuum pipeline are sealed through the beryllium windows. With the disclosed device, the X-rays can be transmitted to the central position of the strong magnet cavity remotely, so that the intensityloss in the X-ray transmission process is reduced effectively and the X-ray radiation is protected.

Description

technical field [0001] The invention relates to the technical field of X-ray transmission equipment, in particular to an X-ray transmission device under a strong magnetic field. Background technique [0002] At present, the combination of strong magnetic field and X-ray diffraction technology, the development of X-ray diffraction platform under strong magnetic field, can be used to study the lattice structure changes of materials under strong magnetic field, which not only provides the key to the microscopic mechanism of physical effects under strong magnetic field The complete structural information, and can provide a reference for material design based on micro-scale effects. However, X-ray light sources are easily affected by magnetic fields. For example, magnetic fields can shift the light spot of the light source's electron beam, causing the focus to move, which may affect the calibration of the diffractometer and even prevent the cooling of the anode. Therefore, the l...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20008G01N23/20
CPCG01N23/20008G01N23/20
Inventor 胡林陈乾旺高关胤
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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