Analog-to-digital converter device and to-be-tested signal generation method
A technology for analog-digital and digital signals, which is applied in the field of time-interleaved analog-to-digital converters and the generation of signals to be measured, which can solve problems such as the increase of circuit area, and achieve the effect of reducing hardware cost and difficulty.
Active Publication Date: 2019-11-26
GLOBAL UNICHIP CORPORATION +1
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Problems solved by technology
For example, as the resolution becomes higher and higher, the number of pins to be measured by the analog-to-digital converter is also increasing, which will cause the circuit area to become larger
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[0020] All terms used herein have their ordinary meanings. The definitions of the above-mentioned words in commonly used dictionaries, and the use examples of any words discussed here in the content of this specification are only examples, and should not limit the scope and meaning of the disclosure. Likewise, the disclosure is not limited to the various embodiments shown in this specification.
[0021] As used herein, "coupling" or "connection" can refer to two or more elements in direct physical or electrical contact with each other, or indirect physical or electrical contact with each other, and can also refer to two or more components. Components operate or act on each other.
[0022] In this document, the term "circuitry" generally refers to a single system formed by one or more circuits. The term "circuit" generally refers to an object that is connected in a certain way by one or more transistors and / or one or more active and passive components to process signals.
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The invention discloses an analog-to-digital converter device and a to-be-tested signal generation method. The analog-to-digital converter device includes a plurality of analog-to-digital converter circuitry and data output circuitry. The plurality of analog-to-digital converter circuitry respectively corresponds to a plurality of channels and converts an input signal according to a plurality of interleaved clock signals to generate a plurality of quantized outputs, where each of the clock signals has a sampling frequency. The data output circuitry performs a downsampling operation according to the control signal and the quantized outputs to output a digital signal. The digital signal is used for determining the efficiency of the analog-to-digital converter circuit systems, the frequency of the digital signal is equivalent to N / M times of the sampling frequency, and N is a positive integer and is the number of the channels. According to the scheme, down-sampling operation can be carried out on the quantized outputs of the plurality of channels to generate signals to be detected with low frequency. In this way, the hardware cost and difficulty of measuring the overall performance ofthe analog-to-digital converter device can be reduced.
Description
technical field [0001] This case relates to an analog-to-digital converter device, and in particular to a time-interleaved analog-to-digital converter and a method for generating a signal to be tested. Background technique [0002] Analog-to-digital converters are commonly used in various electronic devices to convert analog signals to digital signals for signal processing. As the resolution and operation speed of the ADC become higher and higher, the cost and difficulty of measuring the performance of the ADC become higher and higher. For example, as the resolution gets higher and higher, the number of pins to be measured by the analog-to-digital converter also increases, which will result in a larger circuit area. Or, when the operation speed is faster and faster, the data transmission rate of the converted digital signal is also faster and faster, resulting in higher and higher specification requirements for the measuring instrument. Contents of the invention [0003]...
Claims
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IPC IPC(8): H03M1/12
CPCH03M1/1205H03M1/1215H03M1/1071
Inventor 汪鼎豪
Owner GLOBAL UNICHIP CORPORATION