Topic model-based software defect detection method and system
A software defect, topic model technology, applied in the field of security detection, to achieve the effect of enhancing security and reliability, and improving quality
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0035] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.
[0036] A method for software defect detection based on a topic model provided by the present invention includes:
[0037] Space construction step: make the static source code generate the corresponding abstract syntax tree, map the abstract syntax tree to the digital feature vector space, and construct the original matrix;
[0038] Semantic analysis step: build a defect pattern library, perform singular matrix decomposition on the defect pattern library to reduce dimensionality, form a reconstruction ma...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com