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A MEASUREMENT METHOD OF MEMORY UNIT QUALITY APPLICED TO WEAR-LEVELING

A storage unit and quality measurement technology, applied in the field of storage unit quality measurement, can solve the problems of disregarding the difference in the degree of loss and the low accuracy of the storage unit quality measurement method, and achieves high accuracy, low measurement cost, and high measurement efficiency. Effect

Active Publication Date: 2021-04-06
FUTUREPATH TECH
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  • Application Information

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Problems solved by technology

[0006] Aiming at the defects of the prior art, the purpose of the present invention is to propose a storage unit quality measurement method applied to wear leveling, aiming at solving the storage unit quality measurement caused by the prior art not considering the difference in the degree of wear of storage units in different periods The problem of low accuracy of the method

Method used

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  • A MEASUREMENT METHOD OF MEMORY UNIT QUALITY APPLICED TO WEAR-LEVELING

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Embodiment

[0038] Taking the storage block in the flash memory (NAND flash) under a certain manufacturing process, that is, the storage unit, as the measurement object and quality measurement object of this embodiment, the quality measurement method includes:

[0039] S1. According to the measurement capability of the actual storage system, select a plurality of feature values ​​from the storage unit feature set as the storage unit quality measurement feature;

[0040]Specifically, the storage system where the storage block in the flash memory (NAND flash) is located can measure the operating time of the storage unit, the number of programming / erasing cycles and The number of error bits, so the operating time of the storage unit, the number of programming / erasing cycles and the number of error bits that the storage unit has experienced currently are selected as the storage unit quality measurement feature for quality measurement; wherein, the operation time of the storage unit includes th...

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Abstract

The invention discloses a storage unit quality measurement method applied to wear leveling, comprising the following steps: S1. According to the measurement capability of an actual storage system, a plurality of feature values ​​are selected from the feature set of the storage unit as the storage unit quality measurement feature; S2. Calculate and obtain a storage unit quality measurement result according to the storage unit quality measurement feature and the pre-trained storage unit quality measurement model. The present invention takes into account the difference in the degree of loss of the storage unit in different periods, adopts multiple measurement features such as operating time and threshold voltage distribution that can more accurately reflect the current reliability state of the storage unit, and establishes an accurate storage unit for wear leveling The unit quality measurement model can greatly improve the accuracy of quality measurement results, thereby improving the performance efficiency of storage system loss leveling and prolonging the service life of the storage system.

Description

technical field [0001] The invention belongs to the field of storage unit quality measurement, and more particularly relates to a storage unit quality measurement method applied to loss leveling. Background technique [0002] With the development of information technology, memory, as the carrier of storing data in electronic equipment, has become more and more important in the fields of communication, consumption, computer, industrial control, military and other fields, but low reliability has always been one of the main problems of memory . [0003] Wear leveling (also known as wear leveling) is a technique for extending the useful life of erasable computer storage media such as solid-state drives (SSDs), USB flash drives, and phase-change memory. In the absence of wear leveling, the underlying flash controller must permanently assign the operating system's logical addresses to the flash's physical addresses. This means that every write to a previously written block must ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C16/34
CPCG11C16/3495
Inventor 刘政林潘玉茜陈卓文思诚
Owner FUTUREPATH TECH
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