Dynamic part average testing (DPAT) method for automatic test equipment (ATE) system

A test method and post-test technology, applied in the field of DPAT test, can solve problems such as prolonging the test cycle, wasting time and resources, failing to link test and sorting results to components, etc., so as to improve mass production efficiency and prevent manual errors Effect

Active Publication Date: 2019-12-20
BEIJING HUAFENG TEST & CONTROL TECH CO LTD
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Problems solved by technology

But for the FT test (Final test), generally the product will be taped or labeled after the test, and once the components are taped, there is no way to track or arrange them in order, and it is impossible to compare the test and sorting results with the specific components. Therefore, this post-processing will waste a lot of time and resources, prolonging the test cycle

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  • Dynamic part average testing (DPAT) method for automatic test equipment (ATE) system
  • Dynamic part average testing (DPAT) method for automatic test equipment (ATE) system
  • Dynamic part average testing (DPAT) method for automatic test equipment (ATE) system

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Embodiment Construction

[0043] The main purpose of the present invention is to provide a kind of DPAT test method for ATE system, by carrying out sampling test to the part product of current batch, select new criterion according to the data distribution of sampling test, and utilize new criterion Conduct mass production testing. Through the present invention, without affecting the test time and uninterrupted test process, each product in the mass production test can be screened and graded, and new criteria can be switched in real time according to the characteristics of the current batch of products , less time-consuming and less error-prone, improving mass production efficiency.

[0044] Below, refer to figure 1 ~ as image 3 As shown, the DPAT test method for the ATE system described in the present invention will be described in detail.

[0045] Such as figure 1 As shown, the DPAT test method for ATE system provided by the present invention is divided into two parts:

[0046] S100: test progra...

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Abstract

The invention provides a dynamic part average testing (DPAT) method for an automatic test equipment (ATE) system. The DPAT method comprises the step of for parameters of DPAT, setting two parameters which are used for storing an upper limit and a lower limit of a new criteria respectively; and further comprises following steps of A, sampling and testing some products of a current batch; B, determining a new criteria according to distribution of testing data in a sampling and testing result, and storing the new criteria in the two parameters; and C, performing mass production test on products of the current batch according to the new criteria. DPAT is realized rapidly in testing by ATE; each product in mass production test is screened and graded while test time is not affected and test flowis not interrupted, so that manual errors are prevented, and mass production is more efficient.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to a DPAT testing method for an ATE system. Background technique [0002] As the number of electronic components in automobiles continues to increase, the quality of semiconductor components in modern vehicles must be strictly controlled to reduce the defect rate per million parts and minimize field return and warranty issues related to electronic components , and reduce liability issues caused by failure of electronic components. The AEC-Q001 specification of the American Automotive Electronics Council recommends a general Part Average Testing (PAT) method, which tests and collects data for multiple batches, and calculates for each screening condition through the calculation of the algorithm library The test establishes a PAT limit value, which is integrated in the test program as the upper specification limit (USL) and lower specification limit (LSL), and any t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2834
Inventor 尹诗龙王庆泉周伟
Owner BEIJING HUAFENG TEST & CONTROL TECH CO LTD
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