Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Modularized sealed device for preparing film through spatial isolation atomic layer deposition

A technology of atomic layer deposition and space isolation, which is applied in the direction of coating, gaseous chemical plating, metal material coating process, etc., can solve problems such as difficult isolation, achieve the effects of isolating pollution, avoiding use, and reducing thermal deformation

Active Publication Date: 2020-01-07
HUAZHONG UNIV OF SCI & TECH
View PDF6 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, there are still many problems in the development of SALD technology. First, some inventions have not discarded the high vacuum chamber used in traditional ALD. The purpose is to ensure the quality of the deposition environment and prevent water and other pollution in the air under normal pressure. Second, although some inventions abandon the high-vacuum chamber, it is difficult to achieve effective isolation because it is in an open environment and there is no other means of protection. The isolation here includes the isolation between precursors , including isolation of impurities in the air from the reaction zone

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Modularized sealed device for preparing film through spatial isolation atomic layer deposition
  • Modularized sealed device for preparing film through spatial isolation atomic layer deposition
  • Modularized sealed device for preparing film through spatial isolation atomic layer deposition

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0036] Such as Figure 1~3 As shown, the embodiment of the present invention provides a modular sealed space-isolated atomic layer deposition thin film equipment, which includes a moving device, a nozzle device, a sealing device and a reaction device, wherein:

[0037]The motion device comprises a first moving mover 102, a second moving mover 103, a horizontal track, a linear motor 101 and a li...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the related field of micro and nano fabrication, and particularly discloses a modularized sealed device for preparing a film through spatial isolation atomic layer deposition.The device comprises a moving device, a spray head device, a sealing device and a reaction device, wherein the moving device is used for driving the sealing device and the reaction device to move along a horizontal rail and driving the spray head device to move in the vertical direction; a sealing cavity of the spray head device is connected with a lifting table; a sealing cavity cover plate is fixed above the sealing cavity; a modularized spray head is fixed below the sealing cavity; the sealing device and the spray head device are in sealing fit; and the reaction device is arranged below the spray head device to do reciprocating motion to realize the spatial isolation atomic layer deposition. The reaction device is arranged below the spray head device to do reciprocating motion to realize spatial isolation atomic layer deposition; and when atomic layer deposition is not performed, the sealing device is moved to a part below the spray head device to seal the spray head device to ensure the vacuum degree of the spray head device so as to realize the modularized sealing.

Description

technical field [0001] The invention belongs to the field related to micro-nano manufacturing, and more specifically relates to a modular sealed space-isolated atomic layer deposition thin film equipment. Background technique [0002] With the continuous development of semiconductor technology, the packaging requirements for the surface of materials in solar panels, flexible electronics and other fields are also increasing. ALD, or Atomic Layer Deposition, is a method that can coat substances layer by layer on the surface of a substrate in the form of a monoatomic film. Although this atomic layer deposition process has similarities with ordinary chemical deposition, in the process of atomic layer deposition, the chemical reaction of a new layer of atomic film is directly related to the previous layer. This way makes each reaction only A layer of atoms can be deposited. [0003] ALD is attracting increasing attention because of its wide range of applications and the excelle...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C23C16/455C23C16/46C23C16/54
CPCC23C16/4409C23C16/45544C23C16/45563C23C16/46C23C16/54
Inventor 陈蓉黄奕利曹坤李云邓匡举宋光亮
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products