Near-infrared spectrum feature extraction method and device

A near-infrared spectroscopy and feature extraction technology, applied in the field of pattern recognition and non-destructive testing, can solve the problems of uncertainty, difficult to optimize analysis models, low data integrity, etc., to solve the loss of feature information, ensure data integrity, and increase effective effect of information

Active Publication Date: 2020-01-07
ANHUI UNIVERSITY +1
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AI Technical Summary

Problems solved by technology

The existing feature extraction algorithms have different effects according to the characteristics of the analysis object and the acquired data. Specifically, all analysis methods are not universal and can only work on the analysis objects with one or several data structures. When detecting When the frequency of object changes is high, the effectiveness of existing analysis methods cannot be ensured;
[0004] (2) The integrity of feature data is low
The integrity of the characteristic data determines the validity, stability and comprehension of the built model. The existing analysis methods can only realize the selection or data compression of the near-spectral data interval, but cannot realize the

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  • Near-infrared spectrum feature extraction method and device
  • Near-infrared spectrum feature extraction method and device

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Example Embodiment

[0066] Example 1

[0067] A near-infrared spectral feature extraction method, the method comprising:

[0068] First, obtain N samples to be tested from the total samples by using conventional selection or expert system, where conventional selection refers to selecting complete, relatively good, and undeteriorated samples by manual screening. The expert system is Refers to the integration of expert experience into the information system, and the computer replaces the manual work of sample selection;

[0069] Then, the N samples to be tested and the spectrometer are placed on the near-infrared spectrum detection platform, and the spectrometer is used to obtain the near-infrared spectral data of the N samples to be tested;

[0070] After obtaining the near-infrared spectral data, preprocessing the near-infrared spectral data to obtain two-dimensional near-infrared spectral smooth data, including: constructing a local model with a length of 2λ+1 for the current sample to be teste...

Example Embodiment

[0089] Example 2

[0090] Corresponding to Embodiment 1 of the present invention, Embodiment 2 of the present invention further provides a near-infrared spectral feature extraction device, the device comprising:

[0091] The screening module is used to obtain N samples to be tested;

[0092] The spectral data acquisition module is used to obtain the near-infrared spectral data of N samples to be tested by using the spectrometer;

[0093] The smoothing processing module is used to preprocess the near-infrared spectral data to obtain two-dimensional near-infrared spectral smoothed data;

[0094] The four-dimensional spectral data acquisition module is used to obtain four-dimensional spectral data by arranging and converting the two-dimensional near-infrared spectral smooth data;

[0095] The feature extraction module is used for feature extraction on the four-dimensional spectrogram data;

[0096] The feature arrangement module is used to perform feature arrangement on the four...

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Abstract

The invention discloses a near-infrared spectrum feature extraction method and device. The method comprises the following steps: acquiring to-be-detected N samples; acquiring near-infrared spectrum data of the N to-be-detected samples by using a spectrograph; preprocessing the near-infrared spectrum data to obtain two-dimensional near-infrared spectrum smooth data; arranging arrangement and conversion on the two-dimensional near-infrared spectrum smooth data to obtain four-dimensional spectrogram data; carrying out feature extraction on the four-dimensional spectrogram data; and then carryingout feature arrangement on the four-dimensional spectrogram data after feature extraction to obtain two-dimensional feature data. The near-infrared spectrum feature extraction method and device have the following advantages: the data integrity can be guaranteed; feature extraction can be carried out in a full-spectrum interval; and the information is protected from being lost.

Description

technical field [0001] The invention relates to the fields of pattern recognition and non-destructive testing, and more specifically relates to a near-infrared spectrum feature extraction method and device. Background technique [0002] Near-infrared spectroscopy analysis technology is an analysis method that utilizes the optical characteristics of chemical substances in the near-infrared spectrum range to achieve qualitative and quantitative rapid detection of detection objects. It has the advantages of less sample consumption, no sample damage, fast analysis speed, and low detection cost. , No waste pollution and other conventional detection and analysis methods can not match the advantages. After years of technological development and improvement, this technology has been widely used in important national production fields such as agriculture, petroleum, medicine, chemical industry, and food. With the continuous development of my country's market economy and the improvem...

Claims

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Application Information

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IPC IPC(8): G01N21/359
CPCG01N21/359
Inventor 潘天红郭威李鱼强陈山皱小波
Owner ANHUI UNIVERSITY
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