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An x-diffraction in-situ test device for electrochromic thin films

An electrochromic, in-situ testing technology, used in measurement devices, material analysis using radiation diffraction, material analysis using wave/particle radiation, etc. X-ray intensity, etc.

Active Publication Date: 2022-06-24
BEIJING UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Since many reactions occur in in-situ experiments, in-situ XRD devices generally need to take measures such as covering the film or sealing the beryllium window, but these measures will affect the intensity of the incident X-rays, and the data with sufficient accuracy cannot be obtained. Measure time, so it is not suitable for observing small real-time changes in a short period of time

Method used

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  • An x-diffraction in-situ test device for electrochromic thin films
  • An x-diffraction in-situ test device for electrochromic thin films
  • An x-diffraction in-situ test device for electrochromic thin films

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Embodiment Construction

[0030] see figure 1 As shown, the present invention is an in-situ X-diffraction test tool for realizing electrochromic film on a diffractometer by combining a sample tank with a three-electrode system and a lifting bracket, including:

[0031] The positioning column (1) is located outside the sample tank (3), in the middle of the front end, and the length and width are required to be equal to 15mm×8mm. This is determined by the structure of the Shimadzu diffractometer. When the in-situ measurement device is installed on the diffractometer, the front side of the positioning column is close to the inner wall of the goniometer, and the upper top surface is close to the middle protrusion of the goniometer, which just occupies the middle of the sample holder of the diffractometer. The entire in-situ device is close to and perpendicular to the surface of the goniometer, and is located on the vertical axis of the goniometer with the positioning column as the center.

[0032] The po...

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Abstract

The invention relates to an X-diffraction in-situ test device for electrochromic thin films, which belongs to the field of X-diffraction. It is characterized in that: taking the electrochromic thin film lithium titanate as the research object, using lithium titanate as the working electrode (6), the reference electrode (4) being Ag / AgCl and the auxiliary electrode Pt (5); the working electrode (6) It forms a circuit with the reference electrode (4) to determine the electrode potential; the working electrode (6) and the auxiliary electrode (5) form another circuit to conduct current; the electrolyte is inorganic lithium salt powder containing conductive lithium ions ‑Organic solvent electrolyte; the overall structure is divided into two parts; the upper part takes the sample tank (3) as the main body, and the lower part is the liftable support. Under the in-situ X-ray diffraction, there is no need to consider the sealing or light-transmitting system, and real-time subtle changes can be observed in a short period of time.

Description

Technical field: [0001] The X-diffraction testing technology relates to the field of large-scale instrument testing equipment. The invention relates to an X-diffraction in-situ testing device. Background technique: [0002] With the development of science and technology and the continuous increase of scientific research investment, the demand for X-ray diffraction in-situ testing has become increasingly fierce. Due to the complex equipment, the currently known in-situ X-ray diffraction is limited to in-situ temperature variation, in-situ stretching, and in-situ batteries. Only in-situ high-temperature devices are sold on the market, and only for powder samples, which are complicated to operate, expensive and limited in use. Other in-situ devices are mostly found in universities and scientific research institutes, and are designed and produced by themselves to meet their own needs. Since many reactions occur in in-situ experiments, in-situ XRD devices generally need to take...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/207G01N23/20025
CPCG01N23/20G01N23/20025
Inventor 汤云晖汪浩刘晶冰
Owner BEIJING UNIV OF TECH