A preparation method of Cu-based CVD diamond heat sink with micro-through holes

A diamond and micro-via technology, which is applied in the field of micro-via Cu-based CVD diamond heat sink and its preparation, can solve the problems of damage to electronic components and large thermal expansion coefficient, and achieve improved adhesion, excellent heat dissipation performance, Excellent cooling effect

Active Publication Date: 2021-08-17
SHAANXI UNIV OF SCI & TECH
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the large thermal expansion coefficient of Ag, Cu, Al and other traditional heat dissipation materials for electronic packaging, the expansion after heating is easy to cause cyclic thermal stress to damage electronic components. Obviously, it can no longer meet the requirements of current advanced electronic technology for packaging heat dissipation materials.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A preparation method of Cu-based CVD diamond heat sink with micro-through holes
  • A preparation method of Cu-based CVD diamond heat sink with micro-through holes
  • A preparation method of Cu-based CVD diamond heat sink with micro-through holes

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0053] A preparation method of a micro-through hole Cu-based CVD diamond heat sink sheet of the present invention comprises the following steps:

[0054] S1, cleaning the surface of the Cu substrate;

[0055] see figure 2 , and cut the oxygen-free copper base wire with a purity of 99.99% to 99.999% and a diameter of 10 to 20 mm into copper sheets of 0.5 to 1 mm as a Cu base.

[0056] The Cu substrate was cleaned with hydrochloric acid solution, acetone, alcohol, and deionized water in sequence for 3 to 5 minutes to remove the oxide film and organic matter on the surface of the Cu substrate, and dried with nitrogen.

[0057] S2, the surface of the Cu substrate is evaporated to form a carbide metal transition layer, which improves the bonding force between the Cu substrate and the diamond.

[0058] Main process parameters: sputtering power 80-100W, air pressure 1.0-1.5Pa, temperature 300-400℃, Ar gas flow 20-30sccm, time 10-15min; metal transition layer materials include tung...

Embodiment 1

[0073] S1. Cut an oxygen-free copper substrate wire with a purity of 99.99% and a diameter of 10 mm into 0.5 mm copper sheets as the Cu substrate, and sequentially use hydrochloric acid solution, acetone, alcohol, and deionized water to clean the Cu substrate for 3 minutes to remove the oxide film and Cu substrate. Organic matter on the surface of the substrate, blow dry with nitrogen;

[0074] S2. Control sputtering power of 80W, air pressure of 1.0Pa, temperature of 300°C, Ar gas flow of 20sccm, and time of 10min; metal transition layer materials include tungsten, molybdenum, titanium, iron, chromium, nickel, cobalt, hafnium, zirconium, neodymium, vanadium , tantalum, yttrium or aluminum, etc., form a carbide metal transition layer by vapor deposition on the surface of the Cu substrate;

[0075] S3. Electrostatically assemble diamond nanoparticles on the surface of the transition metal to improve the nucleation density of diamond on the metal transition layer, and the diamon...

Embodiment 2

[0083] S1. Cut an oxygen-free copper substrate wire with a purity of 99.99% and a diameter of 14 mm into 0.6 mm copper sheets as the Cu substrate, and sequentially use hydrochloric acid solution, acetone, alcohol, and deionized water to clean the Cu substrate for 4 minutes to remove the oxide film and Cu substrate. Organic matter on the surface of the substrate, dry with nitrogen;

[0084] S2. Control sputtering power of 80-100W, pressure of 1.2Pa, temperature of 340°C, flow of Ar gas of 24sccm, and time of 12min; metal transition layer materials include tungsten, molybdenum, titanium, iron, chromium, nickel, cobalt, hafnium, zirconium, neodymium , vanadium, tantalum, yttrium or aluminum, etc., to form a carbide metal transition layer by vapor deposition on the surface of the Cu substrate;

[0085] S3. Electrostatically assemble diamond nanoparticles on the surface of the transition metal to improve the nucleation density of diamond on the metal transition layer, and the diamo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention discloses a Cu-based CVD diamond heat sink with micro-through holes and a preparation method thereof. It comprises a Cu base, a metal transition layer and a CVD diamond film from bottom to top. The arrays on the Cu base are distributed with a diameter of 0.3 to 0.5 mm and a pitch of 0.3 mm. 2-3mm micro-holes, electrostatic assembly of diamond nanoparticles on the surface of the metal transition layer. The heat dissipation effect of the present invention is better than traditional heat sinks such as Ag, Cu, Al, etc., and the adhesion between the diamond film and the Cu metal substrate is improved, as well as the nucleation density of diamond; the heat dissipation performance of the microchannel Cu-based diamond heat sink is better excellent.

Description

technical field [0001] The invention belongs to the technical field of diamond material application, and in particular relates to a micro-through hole Cu-based CVD diamond heat sink and a preparation method thereof. Background technique [0002] With the rapid development of microelectronic integration technology and high-density assembly technology of hollow-core printed boards, the design and production of electronic components and electronic systems continue to develop in the direction of miniaturization, light weight, compactness and efficiency. The power density of electronic components and electronic systems is getting higher and higher, resulting in a large amount of heat generated during operation. If the heat is not removed in time, it will seriously affect the working stability and safety and reliability of electronic components and electronic systems. Therefore, , the heat dissipation problem has become a key issue to be solved urgently in the field of electronic ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & AuthorityPatents(China)
IPC IPC(8): H01L23/373C23C28/04C23C14/24C23C14/06C23C16/27C23C16/02B81C1/00
CPCB81C1/00349B81C1/0069C23C14/0021C23C14/0635C23C14/24C23C16/0272C23C16/27C23C28/04H01L23/3732H01L23/3733H01L23/3736
Inventor王进军
OwnerSHAANXI UNIV OF SCI & TECH