Manual test fixture for integrated circuit aging test

Abstract

The invention discloses a manual test fixture for an integrated circuit aging test. The fixture comprises a test cover and an integrated circuit test seat. The test cover is positioned above the integrated circuit test seat; the test cover can cover the integrated circuit test seat; a temperature sensor is arranged on the test cover; the temperature sensor can be in contact with the upper surfaceof a to-be-tested integrated circuit on the integrated circuit test seat; the temperature sensor is elastically connected with the test cover; a cooling component for cooling the to-be-tested integrated circuit and a heating component for heating the to-be-tested integrated circuit are arranged on the test cover; the heating component, the cooling component and the temperature sensor are respectively connected to a first pin and a third pin of a control connector of the temperature control equipment; a fifth pin and a sixth pin of the control connector are connected with the temperature sensorin series; and a second pin and a fourth pin of the control connector are grounded. According to the invention, the to-be-tested integrated circuit can be effectively heated, so that the integrated circuit is in a temperature range meeting requirements and is used for aging test of the integrated circuit.

Description

technical field [0001] The invention relates to a manual test fixture for integrated circuit aging test. Background technique [0002] Traditional integrated circuit burn-in testing requires placing test fixtures in a closed space (aging furnace) and controlling the ambient temperature in the closed space, so as to speed up the service life of integrated circuits. However, this method requires a large number of test fixtures to improve efficiency. When the number of integrated circuits is small and each integrated circuit under test needs to be monitored, the traditional burn-in furnace test can no longer meet the requirements. Contents of the invention [0003] In order to overcome the above disadvantages, the object of the present invention is to provide a manual test fixture for integrated circuit aging testing that can effectively heat the integrated circuit to be tested so that the integrated circuit is in a satisfactory temperature range. [0004] In order to achiev...

AI Technical Summary

Problems solved by technology

However, this method requires a large number of test fixtures to improve efficiency. When the number of integrated circuits is small and each integrated circuit to be tested needs to be monitored, the traditional burn-in furnace test can no longer meet the requirements.

Images