A copper ion detection method based on quantum dot-nanochannel

Abstract

The present invention provides a method for detecting copper ions based on quantum dot-nanochannel, comprising the steps of: preparing a CdSe@ZIF-8 / PAA film; using the CdSe@ZIF-8 / PAA film to make a film suitable for an inverted fluorescence microscope The chip includes a liquid storage tank, and the CdSe@ZIF-8 / PAA membrane is located in the liquid storage tank, wherein a working electrode is also placed in the liquid storage tank, and the working electrode is connected to the electrochemical workstation. connected; add electrolyte solution and Cu to the reservoir 2+ solution, the electrochemical workstation applies a potential to achieve Cu 2+ For enrichment, perform fluorescence spectrum scanning on the liquid storage tank through the inverted fluorescence microscope, and obtain spectral signals to realize the detection of Cu 2+ detection. The detection method provided by the invention is easy to operate and low in cost, and can not only detect trace amounts of copper ions, but also visualize the detection process.

Description

technical field [0001] The invention relates to the technical field of chemical sensing, in particular to a copper ion detection method based on quantum dots and nanochannels. Background technique [0002] Copper ions (Cu 2+ ) is a very important and necessary trace element in the living body, but in the human body Cu 2+ The concentration must be kept within a certain range, if Cu 2+ Excessive intake can lead to kidney or liver damage, gastrointestinal disorders, neurodegenerative diseases and disrupted cellular metabolism. With the increasing discharge of industrial wastewater and acid wastewater from coal mines, Cu 2+ Pollution also affects all aspects of people's lives, such as food, drinking water and various industrial products. So far, Cu 2+ There are many quantitative analysis methods, such as: atomic absorption spectrometry, high performance liquid chromatography, ion chromatography, anodic stripping voltammetry, etc. However, these methods have certain disadva...

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Problems solved by technology

[0004] The present invention aims to solve to a certain extent the problems of copper ion detection methods in the prior art which are cumbersome and cannot be visualized.

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