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A non-contact insulating medium response automatic testing method and an electrode box for testing

A fully automatic testing, insulating medium technology, applied in the direction of measuring device, material capacitance, material analysis by electromagnetic means, etc., can solve the problems of fluctuation of test results, reduction of test accuracy, air layer affecting dielectric properties, etc.

Active Publication Date: 2022-04-22
CHONGQING UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The air has fluidity and inhomogeneity, so the test results will fluctuate accordingly, which greatly reduces the test accuracy. The properties of the air must be very stable to achieve good measurement results
Moreover, the thickness of the air layer will also directly affect its dielectric properties, thereby affecting whether it can be used as a benchmark standard.

Method used

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  • A non-contact insulating medium response automatic testing method and an electrode box for testing
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  • A non-contact insulating medium response automatic testing method and an electrode box for testing

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Embodiment Construction

[0035] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that the illustrations provided in the following embodiments are only schematically illustrating the basic idea of ​​the present invention, and the following embodiments and the features in the embodiments can be combined with each other under the condition of no conflict.

[0036] Wherein, the accompanying drawings are for illustrative purposes only, and represent only schematic diagrams, rather than physical drawings, and should not be constru...

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Abstract

The invention relates to a non-contact insulating dielectric response automatic testing method, which belongs to the technical field of frequency domain dielectric response testing, comprising the following steps: S1: Pre-measurement: for the same dielectric material, the combination of measuring samples and air gaps with different thicknesses Response and get the frequency response characteristic curve; S2: Limit fitting: using the frequency response characteristic data obtained in the pre-measurement, the air gap thickness is used as the independent variable, and the air gap thickness is zero when the air gap thickness is zero at the same frequency point through surface fitting. Frequency response characteristics; S3: For subsequent insulating material samples, the thickness of a single air gap is used for routine measurement, and the dielectric properties of the sample material after eliminating the influence of the air gap are obtained through the frequency domain dielectric response curve obtained in steps S1 and S2.

Description

technical field [0001] The invention belongs to the technical field of frequency-domain dielectric response testing, and relates to a non-contact insulating dielectric response automatic testing method and an electrode box for testing. Background technique [0002] The measurement of dielectric response in frequency domain is a very important part in high voltage technology. It puts the insulating medium between the electrode plates, and obtains the dielectric properties of the medium by measuring the response of the insulating medium under different frequency excitations, so as to evaluate the performance parameters such as the aging degree of the medium. [0003] The traditional measurement method uses a measurement method in which both electrodes are in contact with the medium. Generally speaking, it is necessary for the two electrodes to exert a certain pressure on the test sample, so that the electrodes and the test sample can be in close contact, and the gap between th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N27/22
CPCG01N27/221
Inventor 杨丽君沈钟熠赖逸君汤瀚威成立赵学童
Owner CHONGQING UNIV
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