Method and device for measuring a layer thickness of an object
A technology for objects and equipment, applied in the field of layer thickness of plastic objects, to achieve efficient coverage of bandwidth, avoid redundancy, and avoid related difficulties
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[0063] figure 1 The measurement of the layer thickness d of the object 1 is shown schematically. The object 1 has boundary surfaces 2 , 3 separated by a layer thickness d. The layer thickness d of object 1 is at the minimum layer thickness d min with the maximum layer thickness d max Changes in the range between. Minimum layer thickness d min and the maximum layer thickness d max Indicates the minimum or maximum layer thickness to be measured for the measurement. The refractive index n of the object 1 deviates from the refractive index of the surrounding environment of the object 1 . Typically, measurements are made in air or a vacuum, so the environment has a refractive index of 1.
[0064] In order to measure the layer thickness d of the object 1 , electromagnetic radiation 4 is incident on the boundary surface 2 of the object 1 at an angle of incidence b. The angle of incidence b is defined as the angle between the direction of propagation 5 of the electromagnetic r...
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