Device for measuring DLD of crystal oscillator element

Abstract

The invention discloses a device for measuring a DLD of a crystal oscillator element. The device comprises a bottom plate, a supporting rod, a top plate, an open shell, a guide rail, a servo motor, ascrew, a ball nut, a sliding block, a connecting strip, a U-shaped strip, a connecting block, a wool brush, an electric push rod, a connecting rod, a pressing block, a sample strip, a rubber block, acrystal oscillator body, cleaning comb teeth, a first connecting wire, a plastic rubber sleeve, a wire, a contact head, a spring, a limiting ring, a wire storage box, a rotating shaft, a reel, a torsional spring, a second connecting wire, a fixed box, a circuit board, an arbitrary waveform generator, a digital oscilloscope, an output interface, a high-frequency non-inductive adjustable resistor, adigital display power meter, a fan, a first filter screen, a drying agent layer, an exhaust fan, a second filter screen, a single-chip microcomputer, and a handle. According to the invention, a plurality of crystal oscillator bodies can be loaded at one time through the sample strip, the contact head for measurement is driven to move through the horizontal driving structure, and the crystal oscillator bodies can be measured one by one, so that a worker is prevented from repeatedly taking the crystal oscillator bodies for loading and unloading.

Description

technical field [0001] The invention relates to a device for measuring DLD, in particular to a device for measuring DLD of a crystal oscillator element, and belongs to the technical field of piezoelectric crystal element applications. Background technique [0002] As a type of basic electronic components, crystal oscillator components are widely used in various analog or digital circuits to provide high-stability clock signals for electronic circuits; the DLD characteristics of crystal oscillator components are crucial to the stability of crystal oscillator components during use , which reveals the characteristics of the resonant resistance of the crystal element as a function of the excitation level and the dependence of the excitation level. [0003] When the crystal oscillator is measured, the pins of the crystal oscillator need to be in contact with the measuring device to form a loop. When loading the crystal oscillator, it is generally done manually. After a crystal os...

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Problems solved by technology

[0003] When the crystal oscillator is measured, the pins of the crystal oscillator need to be in contact with the measuring device to form a circuit. When the crystal oscillator is loaded, it is generally done manually. After a crystal oscillator is measured, it needs to be removed and replaced with a new crystal oscillator. , it may be necessary to manually take the crystal oscillator body repeatedly for loading and unloading during measurement, the labor intensity of the staff is high, and the measurement efficiency may be low; when measuring the crystal oscillator components, the pins may be covered with dust, which may affect the crystal oscillator. Accuracy of Component DLD Measurements

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