Unlock instant, AI-driven research and patent intelligence for your innovation.

Terahertz transit time device half-sine current pulse reliability test device

A technology of transit time and current pulse, applied in the field of half-sine current pulse reliability test device of terahertz transit time device

Active Publication Date: 2020-04-17
WENZHOU UNIVERSITY
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] To sum up, because the structure and principle of terahertz transit time devices are essentially different from those of traditional diodes, triodes, field effect transistors, laser diodes, photodetectors, etc., none of the devices involves terahertz transit time devices. Reliability Test of Half-sinusoidal Current Pulse of Timing Device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Terahertz transit time device half-sine current pulse reliability test device
  • Terahertz transit time device half-sine current pulse reliability test device
  • Terahertz transit time device half-sine current pulse reliability test device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0060] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0061] Such as figure 1 As shown, in the embodiment of the present invention, a half-sine current pulse reliability test device for a terahertz transit time device is provided, which is used on a terahertz transit time device (DUT) to be tested, including a main controller 1, A sinusoidal voltage signal generating circuit 2, a half-sine heating current pulse forming circuit 3, and an energy storage and discharge circuit 4; wherein,

[0062] One end of the sinusoidal voltage signal generating circuit 2 is connected to the first end a1 of the main controller 1, and the other end is connected to one end of the half-sine heating current pulse forming circuit 3 for receiving the pulse signal issued by the main controller 1, and After the pulse signal is converted into...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a terahertz transit time device half-sine current pulse reliability test device. The terahertz transit time device half-sine current pulse reliability test device comprises a main controller, a sinusoidal voltage signal generation circuit, a half-sine heating current pulse forming circuit and an energy storage and discharge circuit. The sinusoidal voltage signal generation circuit converts the pulse signal into a full-wave sinusoidal voltage signal; the half-sine heating current pulse forming circuit converts the full-wave sine voltage signal into a half-sine heating current pulse and loads the half-sine heating current pulse to the anode of the terahertz transit time device, and the energy storage and discharge circuit generates a half-sine discharge current pulse and loads the half-sine discharge current pulse to the anode of the terahertz transit time device to carry out a reliability test; and the main controller sends out a signal and a control instruction,and judges the reliability state according to the parameters of the half-sine heating current pulse and the half-sine discharging current pulse after passing through the terahertz transition time device. By implementing the method, a convenient, accurate and visual half-sine current pulse reliability test can be carried out on the terahertz transit time device, and used test parameters and reliability indexes are displayed.

Description

technical field [0001] The invention relates to the technical field of electronic components, in particular to a half-sine current pulse reliability test device for terahertz transit time devices. Background technique [0002] In the field of electronic technology reliability, the reliability of electronic devices is the basis for the reliability of electronic equipment, electronic systems and other products. Developing a reliability test device according to relevant technical specifications or technical conditions is a necessary technical means for testing the quality and reliability of electronic devices. In order to ensure that the designed terahertz transit time device can meet the specified reliability index and predict the reliability of the device, it is necessary to carry out systematic reliability tests including half-sine current pulse reliability tests to obtain relevant data. The reliability of the device or the electronic system using the device is predicted, a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2637G01R31/2642
Inventor 韦文生
Owner WENZHOU UNIVERSITY