Computer mainboard standard test platform architecture and computer mainboard standard test method

Abstract

A computer mainboard standard test platform architecture and a test method provided by the invention are modular, high in compatibility, convenient to upgrade and low in upgrading cost. The platform architecture comprises an upper computer (1), an electric control board (2), a power supply part and at least one test channel, the test channel comprises a signal adapter plate (3), a display backlight test module (4), a Type-C module test plate (5) and a test point adapter plate (6). The signal adapter plate is provided with a core plate bottom plate (7) and a plurality of function test plates, the Type-C module test plate is connected with a to-be-tested computer mainboard (9) through a high-frequency probe (8), and the test point adapter plate is connected with the to-be-tested computer mainboard through a common probe (10). The test method comprises the steps of loading a to-be-tested product in place; connecting the to-be-tested product with the Type-C module test board and the test point adapter board; powering on the to-be-tested product; powering on the to-be-tested product for normal detection. The invention is applied to the field of mainboard testing.

Description

technical field [0001] The invention relates to the field of computer motherboard testing, in particular to a computer motherboard standard test platform architecture and a method for testing computer motherboards using the platform architecture. Background technique [0002] With the development of science and technology, computers have become a necessity in people's work and life. When mass-producing computers, how to ensure the quality of each computer is extremely important. However, with the current development of science and technology, the integration of computer motherboards is getting higher and higher, more and more complex, and the upgrading of computers is getting faster and faster, so the updating of testing equipment for computer motherboards is also getting faster and faster. If the computer motherboard test equipment is upgraded synchronously according to the upgrade of the computer motherboard, and the equipment of the previous generation cannot be reused, ...

AI Technical Summary

Problems solved by technology

If the computer motherboard test equipment is upgraded synchronously according to the upgrade of the computer motherboard, and the equipment of the previous generation cannot be reused, then the computer manufacturer needs to invest more and more manpower and material resources to meet the testing needs.

In addition, the existing computer motherboard standard tests are generally designed according to one or several similar computer motherboards, and their compatibility is poor. Different types of computer motherboards and upgraded computer motherboards perform functional tests. It is necessary to redesign the computer motherboard function test platform or change most of the computer motherboard function test platform before it can be put into production test

This greatly increases the research and development cycle and debugging cycle of the test equipment, increases the cost input of the manufacturer, and its reusability is low, such as the next update of the computer motherboard, and the test platform needs to be redesigned, which is extremely costly

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