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High-voltage test data management method and system

A high-voltage test and data management technology, applied in the information field, can solve problems such as inaccurate high-voltage test data and data authenticity verification, and achieve the effect of accurate high-voltage test source data and improved accuracy

Pending Publication Date: 2020-05-12
深圳市智微智能软件开发有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The existing high-voltage test data management will not verify the authenticity of the data, resulting in inaccurate high-voltage test data

Method used

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  • High-voltage test data management method and system

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Embodiment Construction

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0020] The terms "first", "second", "third" and "fourth" in the description and claims of the present invention and the drawings are used to distinguish different objects, rather than to describe a specific order . Furthermore, the terms "include" and "have", as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units is not limited ...

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Abstract

The invention provides a high-voltage test data management method and related products, and the method comprises the following steps that electronic equipment calls a management program correspondingto high-voltage test source data, and generates a management subprogram corresponding to sub-test data of the source data in an editing process of the source data; the electronic equipment detects state information of the sub-test data through the management subprogram; and the electronic equipment manages all the sub-data of the source data according to the source data and the state information of all the sub-test data of the source data. The method provided by the invention has the advantage of improving the data accuracy.

Description

technical field [0001] The invention relates to the field of information technology, in particular to a high-voltage test data management method and system. Background technique [0002] Stencils, or SMT Stencil, is a special mold for SMT. Its main function is to aid in the deposition of solder paste; the purpose is to transfer the exact amount of solder paste to the exact location on the empty PCB. [0003] The existing high-voltage test data management will not verify the authenticity of the data, resulting in inaccurate high-voltage test data. Contents of the invention [0004] Embodiments of the present invention provide a high-voltage test data management method and related products, which have the advantage of improving the accuracy of high-voltage test data. [0005] In a first aspect, an embodiment of the present invention provides a method for managing high voltage test data, the method comprising the following steps: [0006] The electronic device invokes a ma...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F16/242G06F16/28G06F11/14G01R31/12
CPCG06F16/2433G06F16/284G06F11/1448G01R31/12
Inventor 倪欢
Owner 深圳市智微智能软件开发有限公司