A lightweight modeling and simulation method for test equipment functions

Abstract

The invention discloses a lightweight modeling and simulation method for test equipment functions, comprising the steps of: building an automatic test equipment model; Virtual and real joint debugging realizes fault location during test joint debugging. The present invention extracts and summarizes the characteristics of the automatic test equipment and the tested unit through sufficient research on the automatic test equipment and the tested unit, and focuses on refining and summarizing the interface information and data types of the automatic test equipment and the tested unit At the same time, it summarizes and simplifies the internal logic functions of automatic test equipment, realizes the virtualization of functions, and proposes a lightweight test model framework technology. By extracting the most basic meta-model that constitutes the automatic test equipment model and the model of the unit under test, on the basis of the model framework, through the modification of key parameters, the rapid establishment and iteration of the lightweight model are realized.

Description

technical field [0001] The invention belongs to the field of test equipment function modeling and simulation, and in particular relates to a lightweight modeling method for virtualization of test equipment functions and a simulation method for virtual-real joint debugging. Background technique [0002] At present, the joint test of complex products generally faces the problem of long test cycle. The joint test cycle includes the following three links: 1. The development cycle of the unit under test; 2. The development cycle of the test instruction set equipment; 3. The automatic test equipment Development cycle. In an environment that does not have a simulation tool for joint testing, the software and hardware of the above three links must be available at the same time for joint testing. However, the development cycle of the second and third links is usually significantly faster than that of the first link. Therefore, the main reason for the long test cycle is that the dev...

AI Technical Summary

Problems solved by technology

[0006] (1) Too focused on solving a wide range of simulation fields and problems, and lack of professionalism in a specific field;

[0007] (2) The learning time is long and the requirements for developers are high;

[0008] (3) The model redundancy is too large to achieve lightweight simulation;

[0009] (4) The software is closed-loop, unable to import and export models, and the model has low versatility and compatibility;

[0010] (5) It cannot be used as a model description method to connect "design and development" to "test environment"

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