Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multi-channel low-resistance test system

A test system, multi-channel technology, used in electronic circuit testing, printed circuit testing, measuring devices, etc., can solve problems such as interference, lack of online monitoring test status, instability, etc., to achieve the effect of overcoming interference

Pending Publication Date: 2020-05-29
冬烨(上海)机电科技有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the existing technology, manual testing is mostly used. However, technical problems such as interference and instability may occur during the manual measurement process, and there is also a lack of online monitoring of the test status.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-channel low-resistance test system
  • Multi-channel low-resistance test system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. For those skilled in the art, other drawings can also be obtained according to these drawings on the premise of not paying creative efforts.

[0020] In the multi-channel low-resistance test system provided by the present invention, aiming at the requirements of low resistance value and high test accuracy in the PCB path resistance test, technical problems such as interference and instability that may occur in the manual measurement process are overcome, and it is a good solution for PCB multi-channel resistance testing. The perfect solution for channel low resistance testing. This system can not onl...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the technical field of PCB testing, particularly relates to a multi-channel low-resistance test system and is suitable for a PCB access resistance value detection process. Thesystem comprises a data acquisition unit for PCB access resistance data acquisition, a test unit for data acquisition unit detection, an upper computer connected with the test unit and a current source used for providing electric power support, wherein the upper computer is suitable for sending a test instruction for detection of the data acquisition unit to the test unit, the test unit sends a corresponding test signal to the data acquisition unit according to the test instruction, and the upper computer is further suitable for receiving detection data fed back by the data acquisition unit and obtained by the test unit, and is used for monitoring a PCB online. The system is advantaged in that by adopting an automatic control principle, problems of possible interference, instability and the like in the manual measurement process are solved, and long-term on-line monitoring can be performed on the PCB which is placed in the environment test box and is subjected to a high-low temperature impact test, so the resistance change condition of a PCB passage in different environments can be conveniently observed.

Description

technical field [0001] The invention relates to the technical field of PCB testing, in particular to a multi-channel low-resistance testing system. Background technique [0002] PCB (Printed Circuit Board), the Chinese name is printed circuit board, also known as printed circuit board, is an important electronic component, a support for electronic components, and a carrier for electrical connections of electronic components. Because it is made using electronic printing, it is called a "printed" circuit board. [0003] In the PCB multi-channel low-resistance test, low resistance and high test accuracy are required. In the existing technology, manual testing is mostly used. However, technical problems such as interference and instability may occur during the manual measurement process, and there is also a lack of online monitoring of the test status. Contents of the invention [0004] The present invention aims to solve the above-mentioned problems. [0005] To achieve th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R27/02
CPCG01R31/2801G01R27/02
Inventor 谭冬平赵德喜
Owner 冬烨(上海)机电科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products