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Diamond AFM probe system and manufacturing method

A production method and diamond technology, which are applied in scanning probe technology, scanning probe microscopy, measuring devices, etc., can solve the problem that the diamond AFM probe system cannot meet the actual needs and other problems.

Pending Publication Date: 2020-06-02
UNIV OF SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] However, the current diamond AFM probe system cannot meet the practical needs

Method used

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  • Diamond AFM probe system and manufacturing method
  • Diamond AFM probe system and manufacturing method

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Embodiment Construction

[0051] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0052] In some patents, some probe structures are prepared by using methods such as magnetism, electrostatic adsorption and functional group modification, but these probes are easily affected by environmental conditions, and it is difficult to ensure the stability and sensitivity of the probes.

[0053] The characteristics of diamond NV color centers can be maintained from ultra-low temperature to room temperature and atmospheric conditions, which makes the dia...

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Abstract

According to the diamond AFM probe system and the manufacturing method thereof. The diamond AFM probe system is a novel diamond AFM probe system and has high fluorescence collection efficiency, so thedetection sensitivity of the diamond AFM probe system is improved, and the manufacturing method is simple.

Description

technical field [0001] The invention relates to the technical field of diamond AFM probes, and more specifically, to a diamond AFM probe system and a manufacturing method. Background technique [0002] The nitrogen vacancy defect center in diamond is composed of a nitrogen atom replacing a carbon atom and an adjacent vacancy, referred to as NV color center. [0003] The NV color center (nitrogen vacancy color center) has a spin triplet ground state, and its quantum state can be optimized by laser, and its quantum state can be manipulated by microwave. At the same time, the NV color center is a bright and stable single photon source, its fluorescence can be read out by optical means, and its corresponding quantum state can be obtained. At the same time, physical quantities such as magnetic field, temperature, and electric field in the environment will cause changes in the electron spin energy level of the NV color center, thereby affecting the readout information such as the...

Claims

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Application Information

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IPC IPC(8): G01Q60/38
CPCG01Q60/38
Inventor 刘航宇孙豫蒙孙浩宇刘昭昕王孟祺王鹏飞王亚石发展杜江峰
Owner UNIV OF SCI & TECH OF CHINA
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