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Substrate glass defect detection method and device

A technology for glass defects and detection devices, applied in measurement devices, material analysis by optical means, instruments, etc., can solve the problems of small size, low inspection efficiency, and difficulty in judging specific levels and sizes.

Pending Publication Date: 2020-06-05
ZHENGZHOU XUFEI OPTOELECTRONICS TECH +1
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Problems solved by technology

Since the glass of the liquid crystal substrate is transparent, the size of the defect is small, and it is difficult to judge the specific layer and size with the naked eye, and the inspection efficiency is low

Method used

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  • Substrate glass defect detection method and device

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Embodiment Construction

[0031] Specific embodiments of the present disclosure will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present disclosure, and are not intended to limit the present disclosure.

[0032] In the present disclosure, in the case of no contrary description, the used orientation words such as "inside and outside" refer to the inside and outside of the specific structural outline, and the used terms such as "first, second" etc. are only for Distinction of one element from another is not of order or importance.

[0033] Such as figure 1 As shown, the present disclosure provides a substrate glass defect detection method. The steps of the substrate glass defect detection method include: S101, the substrate glass 100 is evenly divided into N detection layers along its thickness direction, and N is a natural number ≥ 4 and be a multiple of 4; S...

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Abstract

The invention relates to a substrate glass defect detection method and device, and the method comprises the steps: substrate glass being uniformly divided into N detection layers in the thickness direction of the substrate glass, and N being a natural number greater than or equal to 4 and to be a multiple of 4; setting the first detection layer to the (N / 4)th detection layer as a first comparisonarea of the substrate glass, setting the (N / 4 + 1)th detection layer to the (3N / 4)th detection layer as a second comparison area of the substrate glass, and setting the (3N / 4 + 1)th detection layer tothe Nth detection layer as a third comparison area of the substrate glass; performing image acquisition on each detection layer at the defect position of the substrate glass; and identifying the acquired image, and comparing the acquired image with the standard defect size of the corresponding comparison area to judge whether the acquired image meets the standard or not. The detection method is convenient for judging whether the substrate glass is qualified or not, and is high in detection precision.

Description

technical field [0001] The present disclosure relates to the field of substrate glass manufacturing and processing, and in particular, to a substrate glass defect detection method and device. Background technique [0002] Liquid crystal substrate glass is the substrate in the display field and is widely used in various displays. With the improvement of pixel and contrast requirements in the display field, the defects of liquid crystal substrate glass should be fewer and smaller. [0003] The defects of liquid crystal substrate glass are mainly manifested as bubbles, platinum, dust, stones, etc. on the glass surface and inside the glass, while the defect requirements of liquid crystal substrate glass are: the defect size of the working surface is not greater than 0.02 mm, and the size of internal defects is not greater than 0.05 mm. The size of the defect on the working surface is not greater than 0.1mm. [0004] Since the face-to-face inspection camera needs to inspect the...

Claims

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Application Information

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IPC IPC(8): G01N21/958
CPCG01N21/958
Inventor 李青李赫然吴松江苏记华刘丹张晓宇尚建威付冲李岗
Owner ZHENGZHOU XUFEI OPTOELECTRONICS TECH
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