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Image focusing method, device and system in target near-field microwave imaging test

A microwave imaging and testing system technology, applied in radio wave measurement systems, measurement devices, satellite radio beacon positioning systems, etc., can solve the problem of large vehicle movement position error, target two-dimensional microwave image defocus, and influence target scattering source positioning and diagnosis to achieve the effect of reducing positioning error, facilitating positioning and diagnosis, and improving the focusing effect

Active Publication Date: 2020-06-09
BEIJING INST OF ENVIRONMENTAL FEATURES
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Problems solved by technology

The disadvantage of this method is that, compared with the high-precision guide rail, the vehicle movement position error is relatively large, which is likely to cause serious defocusing problems in the target two-dimensional microwave image along the azimuth (horizontal) image, thus affecting the positioning of the target scattering source and diagnosis

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  • Image focusing method, device and system in target near-field microwave imaging test
  • Image focusing method, device and system in target near-field microwave imaging test
  • Image focusing method, device and system in target near-field microwave imaging test

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Embodiment Construction

[0047]In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0048] see figure 1 , is a schematic structural diagram of a target near-field microwave imaging test system according to a preferred embodiment of the present invention. like figure 1 As shown, the target near-field microwave imaging test system provided in this embodiment includes: a target to be measured 1 , a measuring device 2 , a motio...

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Abstract

The invention relates to the technical field of target near-field electromagnetic scattering characteristic test and diagnosis, and provides an image focusing method, device and system in a target near-field microwave imaging test, and the method comprises the following steps: constructing a target near-field microwave imaging test system which comprises a tested target, a measurement device, a motion platform, a GPS and a metal ball; controlling the motion platform to move around the center of the tested target, recording the position of the motion platform by using the GPS, controlling the measurement device to perform a sweep frequency test, and acquiring sweep frequency test data; calculating a reference distance and a measurement distance between the metal ball and the motion platform, and obtaining a phase correction factor according to the reference distance and the measurement distance; and compensating the target sweep frequency test data according to the phase correction factor, and performing imaging processing to obtain a focused target two-dimensional microwave image. According to the method, the defocusing phenomenon of the target two-dimensional microwave image caused by the movement error of the motion platform can be eliminated.

Description

technical field [0001] The invention relates to the technical field of target near-field electromagnetic scattering characteristic testing and diagnosis, in particular to an image focusing method, an image focusing device and a near-field target microwave imaging testing system in target near-field microwave imaging testing. Background technique [0002] Microwave imaging diagnosis is an important means of testing the electromagnetic scattering characteristics of targets. Usually, the target to be measured is set up on a high-precision turntable or a metal support with a rotating top, and then the target is driven to rotate through the turntable or rotating top to obtain the measured object. The electromagnetic scattering characteristic data of the target in different azimuths, and finally the two-dimensional microwave image of the target scattering source distribution is obtained based on the aperture synthesis method. This test in which the target is moving and the measuri...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S13/90G01S7/40G01R29/08G01S19/42
CPCG01S13/90G01S7/40G01R29/08G01S19/42G01S13/9088
Inventor 吕鸣候浩浩高超刘芳赵轶伦
Owner BEIJING INST OF ENVIRONMENTAL FEATURES