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Image focusing method, device and system in target near-field microwave imaging test

A microwave imaging and testing system technology, applied in radio wave measurement systems, measurement devices, satellite radio beacon positioning systems, etc., can solve the problem of large vehicle motion position errors, defocusing of two-dimensional microwave images of targets, and affecting the positioning of target scattering sources. It can reduce the positioning error, facilitate the positioning and diagnosis, and improve the focusing effect.

Active Publication Date: 2022-02-11
BEIJING INST OF ENVIRONMENTAL FEATURES
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Problems solved by technology

The disadvantage of this method is that, compared with the high-precision guide rail, the vehicle movement position error is relatively large, which is likely to cause serious defocusing problems in the target two-dimensional microwave image along the azimuth (horizontal) image, thus affecting the positioning of the target scattering source and diagnosis

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  • Image focusing method, device and system in target near-field microwave imaging test
  • Image focusing method, device and system in target near-field microwave imaging test
  • Image focusing method, device and system in target near-field microwave imaging test

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[0047]In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0048] see figure 1 , is a schematic structural diagram of a target near-field microwave imaging test system according to a preferred embodiment of the present invention. Such as figure 1 As shown, the target near-field microwave imaging test system provided in this embodiment includes: a target to be measured 1 , a measuring device 2 , a mo...

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Abstract

The present invention relates to the technical field of target near-field electromagnetic scattering characteristic test and diagnosis, and provides an image focusing method, device and system in target near-field microwave imaging test. The method includes the following steps: constructing a target near-field microwave imaging test system, Including: the measured object, measuring device, motion platform, GPS system, metal ball; control the movement of the motion platform around the center of the measured object, and use the GPS system to record the position of the motion platform, and at the same time control the measurement device to perform frequency sweep test and collect Sweep frequency test data; calculate the reference distance and the measurement distance between the metal ball and the motion platform, obtain the phase correction factor according to the reference distance and the measurement distance; compensate the target frequency sweep test data according to the phase correction factor, and Imaging processing is performed to obtain a focused two-dimensional microwave image of the target. The method of the invention can eliminate the defocus phenomenon of the target two-dimensional microwave image caused by the movement error of the moving platform.

Description

technical field [0001] The invention relates to the technical field of target near-field electromagnetic scattering characteristic testing and diagnosis, in particular to an image focusing method, an image focusing device and a near-field target microwave imaging testing system in target near-field microwave imaging testing. Background technique [0002] Microwave imaging diagnosis is an important means of testing the electromagnetic scattering characteristics of targets. Usually, the target to be measured is set up on a high-precision turntable or a metal support with a rotating top, and then the target is driven to rotate through the turntable or rotating top to obtain the measured object. The electromagnetic scattering characteristic data of the target in different azimuths, and finally the two-dimensional microwave image of the target scattering source distribution is obtained based on the aperture synthesis method. This test in which the target is moving and the measuri...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S13/90G01S7/40G01R29/08G01S19/42
CPCG01S13/90G01S7/40G01R29/08G01S19/42G01S13/9088
Inventor 吕鸣候浩浩高超刘芳赵轶伦
Owner BEIJING INST OF ENVIRONMENTAL FEATURES