A Fault Injection Method Based on Boundary Scan Test Link
A boundary scan test and boundary scan technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of complex fault injection methods, high hardware costs, and complicated timing, so as to facilitate the verification of test capabilities and facilitate fault injection Simple, fault-testable effects
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[0035] For the convenience of description, the relevant technical terms appearing in the specific implementation are explained first:
[0036] JTAG (Joint Test Action Group): Joint Test Working Group, an international standard test protocol for boundary scan, mainly used for chip internal testing;
[0037] Port: The Boundary Scan Description Language file is used to describe all the pin information of the chip, that is, the pin name and pin attributes;
[0038] Constant: The boundary scan description language file is used to describe the mapping between different pin names and corresponding pin numbers;
[0039] TDI: Serial test instruction and serial test data input port conforming to the boundary scan test standard;
[0040] TDO: A serial test instruction and test data output port that conforms to the boundary scan test standard;
[0041] BS (Boundary Scan): boundary scan device;
[0042] Firstly, the typical format of the netlist file is introduced. Taking the Protel V1 ...
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