Photovoltaic module unsupervised defect detection method based on GAN improved algorithm

A photovoltaic module and defect detection technology, which is applied in the direction of optical test defects/defects, computer components, neural learning methods, etc., can solve the problems of poor detection ability of tiny anomalies

Inactive Publication Date: 2020-06-26
ZHEJIANG ZHENENG TECHN RES INST +1
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Problems solved by technology

For photovoltaic crack defects, the defects are not obvious. The existing deep learning algorithms often require samples with a balanced distribution, and can only detect larger objects, and have poor detection capabilities for small anomalies.

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  • Photovoltaic module unsupervised defect detection method based on GAN improved algorithm
  • Photovoltaic module unsupervised defect detection method based on GAN improved algorithm
  • Photovoltaic module unsupervised defect detection method based on GAN improved algorithm

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Embodiment Construction

[0086] The present invention will be further described below in conjunction with the examples. The description of the following examples is provided only to aid the understanding of the present invention. It should be pointed out that for those skilled in the art, without departing from the principle of the present invention, some improvements and modifications can be made to the present invention, and these improvements and modifications also fall within the protection scope of the claims of the present invention.

[0087] Such as figure 1 As shown, the present invention proposes an unsupervised defect detection method for photovoltaic modules based on an improved GAN algorithm, and provides a method for detecting defects in photovoltaic modules that is difficult to identify, has various defect forms, complex detection environments, and extremely unbalanced positive and negative samples. An unsupervised anomaly detection model SSIM-GAN capable of detecting tiny and unknown a...

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Abstract

The invention relates to a photovoltaic module unsupervised defect detection method based on a GAN improved algorithm. The method comprises the following steps: step 1, training a generative adversarial network module according to an SSIM-GAN algorithm model; 2, training an encoder network module according to the SSIM-GAN algorithm model; 3, constructing a defect discrimination module; step 4, carrying out image detection. The method provided by the invention has the beneficial effects that the method can effectively detect tiny and diverse defects of the photovoltaic module, and can solve theproblem of unbalanced samples; an SSIM-GAN model is constructed, and the difference between the images is described by using structural similarity; a normal image is generated through a generative adversarial network; the images are mapped to the corresponding hidden spaces through the encoder network, whether the images to be detected have defects or not is judged through the defect detection module, rapid and accurate detection of unknown defects can be achieved under the condition that the number of the defect images is small, and the method has the advantages of being high in environmental adaptability and robustness.

Description

technical field [0001] The invention belongs to the field of production inspection of industrial products, and in particular relates to an unsupervised defect inspection method for photovoltaic modules based on an improved GAN algorithm. Background technique [0002] Due to the depletion of traditional energy sources, new energy sources represented by solar photovoltaic power generation have developed rapidly in recent years. In the production and processing of photovoltaic cell components, in addition to the defects of the material itself, the multiple processing of the cells on the automated production line will also increase the damage rate of the cells, resulting in hidden cracks, debris, virtual welding, and broken grids. These defects directly affect the conversion efficiency and service life of the product. With the continuous improvement of the level of industrial automation, traditional manual detection is no longer suitable for the current automated production env...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06K9/62G06N3/04G06N3/08G01N21/88
CPCG06T7/0004G06N3/08G01N21/8851G06T2207/10004G06T2207/20081G06T2207/20084G06T2207/30164G01N2021/8887G06N3/045G06F18/22
Inventor 寿春晖洪凌丁莞尔周剑武赵春晖周文浩蒋羽刘轩驿
Owner ZHEJIANG ZHENENG TECHN RES INST
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