X-ray ultrafast detection device and method

Abstract

The invention relates to an X-ray ultrafast detection device and method so as to solve the problems that X-ray ultrafast diagnosis equipment such as a vacuum streak camera and a vacuum framing camerais large in size, high in cost and complex to control and the ultrafast semiconductor diode can not realize X-ray ultrafast detection of sub-picosecond or even femtosecond magnitude. The device comprises a laser, a wavelength conversion mechanism, a time domain amplification mechanism, a photoelectric detector and a reading circuit. Test laser emitted by the laser is transmitted to the wavelengthconversion mechanism. The wavelength conversion mechanism transmits the time domain information of the X-ray pulse signal to be tested to the test laser, and transmits the test laser carrying the X-ray pulse signal time domain information to the time domain amplification mechanism, the time domain amplification mechanism performs time domain broadening on the test laser carrying the X-ray pulse signal time domain information and outputs the test laser to the photoelectric detector, and the photoelectric detector converts a received optical signal into an electric signal and displays the electric signal through the reading circuit.

Description

technical field [0001] The invention relates to an X-ray ultrafast detection device and method. Background technique [0002] At present, the detection of X-rays at home and abroad, especially the ultra-fast detection of short-pulse X-ray signals such as picoseconds and femtoseconds, usually uses ultra-fast diagnostic equipment such as vacuum streak cameras and vacuum framing cameras. This type of equipment mainly uses the photocathode to convert the X-ray pulse signal into an electron emission signal, and then quickly scans the electron emission signal, so as to realize the ultra-fast detection of the X-ray pulse signal. The above-mentioned method involves a vacuum device and a space electronic deflection control, which makes the entire equipment larger in size, higher in cost, and more complicated in the control device. [0003] In addition, the use of traditional semiconductor X-ray detectors for detection mainly uses ultrafast semiconductor diodes to detect incident X-r...

AI Technical Summary

Problems solved by technology

[0004] The object of the present invention is to provide a kind of X-ray ultra-fast detection device and method, to solve the X-ray ultra-fast diagnostic equipment such as vacuum streak camera, vacuum framing camera etc. existing in the prior art and involve vacuum device and space electronic deflection control, make The entire device is large in size, high in cost, and complex in control; ultrafast semiconductor diodes are limited by the time response of the semiconductor detector and the sampling bandwidth of the readout circuit, and cannot achieve sub-picosecond or even femtosecond X-ray ultra- quick detection problem

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